The study of MCM-41 molecular sieves by energy-filtering TEM

K. J. Chao, C. N. Wu, A. S. Chang, Shu-Fen Hu

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

Energy-filtered transmission electron microscopy (EFTEM) was used to examine the distribution of silicon as T-atoms in mesoporous MCM-41 molecular sieves. At nanometer-sized resolution, the Si distribution image derived from electron energy loss spectroscopy (EELS) with Gatan imaging filter (GIF) was found to be ordered and correlated well to the hexagonal array of the one-dimensional channels of MCM-41. In addition, the pore-to-pore distance and the wall thickness of MCM-41 (determined by Si distribution map) are in good agreement with those derived from X-ray diffraction and N2 adsorption methods.

Original languageEnglish
Pages (from-to)287-295
Number of pages9
JournalMicroporous and Mesoporous Materials
Volume27
Issue number2-3
DOIs
Publication statusPublished - 1999 Jan 1

Fingerprint

Molecular sieves
Multicarrier modulation
absorbents
Transmission electron microscopy
transmission electron microscopy
porosity
Electron energy loss spectroscopy
Silicon
energy
energy dissipation
electron energy
Imaging techniques
filters
Adsorption
X ray diffraction
Atoms
adsorption
silicon
diffraction
spectroscopy

Keywords

  • EFTEM
  • MCM-41 molecular sieve
  • Si distribution image
  • Wall thickness

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials

Cite this

The study of MCM-41 molecular sieves by energy-filtering TEM. / Chao, K. J.; Wu, C. N.; Chang, A. S.; Hu, Shu-Fen.

In: Microporous and Mesoporous Materials, Vol. 27, No. 2-3, 01.01.1999, p. 287-295.

Research output: Contribution to journalArticle

Chao, K. J. ; Wu, C. N. ; Chang, A. S. ; Hu, Shu-Fen. / The study of MCM-41 molecular sieves by energy-filtering TEM. In: Microporous and Mesoporous Materials. 1999 ; Vol. 27, No. 2-3. pp. 287-295.
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