TY - GEN
T1 - The single particle tracking system
AU - Chang, Ai Tang
AU - Chang, Yi Ren
AU - Chi, Sien
AU - Hsu, Long
PY - 2010
Y1 - 2010
N2 - In an optical tweezers system, the force measurement with a resolution less than pico-Newton can be achieved by precise measurement and analysis of the trapped particle trajectory. Typically, this single particle tracking technique is realized by a quadrant position sensor which detects the scattering lights of the trapping laser beam from the trapped particle. However, as the radius of the trapped particle is larger than the wavelength of the trapped laser, the scattering pattern becomes complicated, and it limits the tracking region and the signal sensitivity on the trapped particle. To solve this issue, an extra probing laser with optimized focal offset according to the trapping laser is applied to improve the flexibility and performance of our particle tracking system for each particle size. A rule of thumb between the optimized focal offsets and particle size is also concluded from the experimental results and theoretical simulations.
AB - In an optical tweezers system, the force measurement with a resolution less than pico-Newton can be achieved by precise measurement and analysis of the trapped particle trajectory. Typically, this single particle tracking technique is realized by a quadrant position sensor which detects the scattering lights of the trapping laser beam from the trapped particle. However, as the radius of the trapped particle is larger than the wavelength of the trapped laser, the scattering pattern becomes complicated, and it limits the tracking region and the signal sensitivity on the trapped particle. To solve this issue, an extra probing laser with optimized focal offset according to the trapping laser is applied to improve the flexibility and performance of our particle tracking system for each particle size. A rule of thumb between the optimized focal offsets and particle size is also concluded from the experimental results and theoretical simulations.
KW - Particle tracking
KW - Photonic force microscopy
KW - Quadrant-photo detector
UR - http://www.scopus.com/inward/record.url?scp=77958136099&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=77958136099&partnerID=8YFLogxK
U2 - 10.1117/12.860934
DO - 10.1117/12.860934
M3 - Conference contribution
AN - SCOPUS:77958136099
SN - 9780819482587
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Optical Trapping and Optical Micromanipulation VII
T2 - Optical Trapping and Optical Micromanipulation VII
Y2 - 1 August 2010 through 5 August 2010
ER -