The performance of a plate-type photon beam monitor at SRRC

Chu-Nan Chang; Ching Iue Chen; Syn Bin Lee; Ping Chung Tseng; Kuo Tung Hsu

doi:10.1016/0168-9002(90)90097-P

The performance of a plate-type photon beam monitor at SRRC

Chu-Nan Chang, Ching Iue Chen, Syn Bin Lee, Ping Chung Tseng, Kuo Tung Hsu

Department of Physics

Research output: Contribution to journal › Article

3 Citations (Scopus)

Abstract

A photoemission plate-type photon beam monitor has been fabricated and tested using a HeI (21 eV) lamp light source. The sensitivity ΔI IΔs, obtained by using a picoammeter (Keithley Model 617), is 3.38/mm for both OFHC copper plate and tungsten plate which agrees with the theoretical value. Current-voltage converting and voltage-amplifying electronics have also been devised to measure the sensitivity directly. The degradation introduced by the offset voltage of the electronic components has been analyzed. The sensitivity of this monitor has been verified to depend on both the integral part of the spatial distribution of the light on the plate and the background current generated by the picoammeter.

Original language	English
Pages (from-to)	419-421
Number of pages	3
Journal	Nuclear Inst. and Methods in Physics Research, A
Volume	291
Issue number	1-2
DOIs	https://doi.org/10.1016/0168-9002(90)90097-P
Publication status	Published - 1990 May 20

ASJC Scopus subject areas

Nuclear and High Energy Physics
Instrumentation

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Chang, C-N., Chen, C. I., Lee, S. B., Tseng, P. C., & Hsu, K. T. (1990). The performance of a plate-type photon beam monitor at SRRC. Nuclear Inst. and Methods in Physics Research, A, 291(1-2), 419-421. https://doi.org/10.1016/0168-9002(90)90097-P

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abstract = "A photoemission plate-type photon beam monitor has been fabricated and tested using a HeI (21 eV) lamp light source. The sensitivity ΔI IΔs, obtained by using a picoammeter (Keithley Model 617), is 3.38/mm for both OFHC copper plate and tungsten plate which agrees with the theoretical value. Current-voltage converting and voltage-amplifying electronics have also been devised to measure the sensitivity directly. The degradation introduced by the offset voltage of the electronic components has been analyzed. The sensitivity of this monitor has been verified to depend on both the integral part of the spatial distribution of the light on the plate and the background current generated by the picoammeter.",

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