TY - JOUR
T1 - The effect of N-channel polysilicon thin-film transistors with body-block spacers
AU - Lin, Jyi Tsong
AU - Huang, Kuo Dong
AU - Hu, Shu Fen
N1 - Funding Information:
The authors thank the National Nano Device Laboratories (NDL) (Contract No. NDL-95S-C-121) for financially supporting this research. Professor Y.C. Chou and P.J. Yen are also appreciated for their assistance on SEM image collection.
PY - 2007/7
Y1 - 2007/7
N2 - This study investigates structural modifications of the conventional TFT, which is suffers from the short-channel effect in advanced applications. An ideal body-block poly-Si thin-film transistor is successfully fabricated for the first time at a level that achieves high performance characteristics. The output characteristics of the body-block TFT, for instance, the low output conductance in the saturation area and high breakdown voltage, achieve an outstanding improvements compared to a conventional TFT. The poly-Si thin-film treatments of the body-block TFT with NH3 diffusion or body implantation, and their corresponding performance effects, have also been investigated and discussed in depth.
AB - This study investigates structural modifications of the conventional TFT, which is suffers from the short-channel effect in advanced applications. An ideal body-block poly-Si thin-film transistor is successfully fabricated for the first time at a level that achieves high performance characteristics. The output characteristics of the body-block TFT, for instance, the low output conductance in the saturation area and high breakdown voltage, achieve an outstanding improvements compared to a conventional TFT. The poly-Si thin-film treatments of the body-block TFT with NH3 diffusion or body implantation, and their corresponding performance effects, have also been investigated and discussed in depth.
KW - Drain induced barrier lowing (DIBL)
KW - Short-channel effect (SCE)
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U2 - 10.1016/j.sse.2007.02.043
DO - 10.1016/j.sse.2007.02.043
M3 - Article
AN - SCOPUS:34447536172
SN - 0038-1101
VL - 51
SP - 1056
EP - 1061
JO - Solid-State Electronics
JF - Solid-State Electronics
IS - 7
ER -