Abstract
Multilayer BaTiO3/BiFeO3 (BTO/BFO) stack structures were prepared on the Pt/TiO2/SiO2/Si (100) substrate via highly accurate magnetron sputtering process. The cubic to the tetragonal phase transition of BTO was confirmed by both the X-ray diffraction and Raman spectroscopy after the process of rapid thermal anneal. An 74.1% increase of the relative permittivity was observed with the increasing thickness of BFO in the metal-insulator-metal capacitor. On the other hand, we also demonstrate that the leakage current density and the relative permittivity are found to have 20-50 times reduction and 26.6% improvement, respectively, with the additional cap of the BTO layer.
Original language | English |
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Article number | 8466023 |
Pages (from-to) | 4834-4838 |
Number of pages | 5 |
Journal | IEEE Transactions on Electron Devices |
Volume | 65 |
Issue number | 11 |
DOIs | |
Publication status | Published - 2018 Nov |
Keywords
- Barium titanate (BaTiO BTO)
- bismuth ferrite (BiFeO BFO)
- metal-insulator-metal (MIM) capacitor
- multilayer stack
- rapid thermal anneal (RTA)
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering