The correlation between trap states and mechanical reliability of amorphous Si:H TFTS for flexible electronics

Min-Hung Lee, S. T. Chang, S. C. Weng, W. H. Liu, K. J. Chen, K. Y. Ho, M. H. Liao, J. J. Huang, G. R. Hu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Engineering & Materials Science