The Compton profiles of vanadium oxides

Chu Nan Chang*, Chuhn Chuh Chen, Huey Fen Liu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)


The isotropic Compton profiles of vanadium oxides VO, V2O 3, VO2, V6O13 and V 2O5 were measured by using 59.54 keV gamma -rays. The Compton profiles calculated by using the molecular-cluster model were found to be improper in describing the experimental results of VO and VO2. The molecular-cluster model seems to underestimate the metal-ligand covalency. The localization and delocalization of valence electrons when forming oxides will be discussed on the basis of the atomic superposition model.

Original languageEnglish
Article number032
Pages (from-to)10445-10452
Number of pages8
JournalJournal of Physics: Condensed Matter
Issue number50
Publication statusPublished - 1992

ASJC Scopus subject areas

  • General Materials Science
  • Condensed Matter Physics


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