Fingerprint
Dive into the research topics of 'Test structure on SCR device in waffle layout for RF ESD protection'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Test structure on SCR device in waffle layout for RF ESD protection
Ming Dou Ker*, Chun Yu Lin
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
5
Citations
(Scopus)