Test structure on SCR device in waffle layout for RF ESD protection

Ming Dou Ker, Chun Yu Lin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

With the highest ESD level in a smallest layout area, SCR device was used as effective on-chip ESD protection device in CMOS technology. In this paper, a waffle layout test structure of SCR is proposed to investigate the current spreading efficiency for ESD protection. The SCR in waffle layout structure has smaller parasitic capacitance under the same ESD robustness. With smaller parasitic capacitance, the degradation on RF circuit performance due to on-chip ESD protection device can be reduced. The proposed waffle SCR is suitable for on-chip ESD protection in RF applications.

Original languageEnglish
Title of host publication2007 IEEE International Conference on Microelectronic Test Structures, ICMTS - Conference Proceedings
Pages196-199
Number of pages4
DOIs
Publication statusPublished - 2007 Sep 27
Event2007 IEEE International Conference on Microelectronic Test Structures, ICMTS '07 - Bunkyo-ku, Japan
Duration: 2007 Mar 192007 Mar 22

Publication series

NameIEEE International Conference on Microelectronic Test Structures

Other

Other2007 IEEE International Conference on Microelectronic Test Structures, ICMTS '07
CountryJapan
CityBunkyo-ku
Period07/3/1907/3/22

Fingerprint

Thyristors
Capacitance
Degradation
Networks (circuits)

Keywords

  • Electrostatic discharges (ESD)
  • Radio-frequency integrated circuit (RF IC)
  • Silicon-controlled rectifier (SCR)

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Ker, M. D., & Lin, C. Y. (2007). Test structure on SCR device in waffle layout for RF ESD protection. In 2007 IEEE International Conference on Microelectronic Test Structures, ICMTS - Conference Proceedings (pp. 196-199). [4252432] (IEEE International Conference on Microelectronic Test Structures). https://doi.org/10.1109/ICMTS.2007.374482

Test structure on SCR device in waffle layout for RF ESD protection. / Ker, Ming Dou; Lin, Chun Yu.

2007 IEEE International Conference on Microelectronic Test Structures, ICMTS - Conference Proceedings. 2007. p. 196-199 4252432 (IEEE International Conference on Microelectronic Test Structures).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ker, MD & Lin, CY 2007, Test structure on SCR device in waffle layout for RF ESD protection. in 2007 IEEE International Conference on Microelectronic Test Structures, ICMTS - Conference Proceedings., 4252432, IEEE International Conference on Microelectronic Test Structures, pp. 196-199, 2007 IEEE International Conference on Microelectronic Test Structures, ICMTS '07, Bunkyo-ku, Japan, 07/3/19. https://doi.org/10.1109/ICMTS.2007.374482
Ker MD, Lin CY. Test structure on SCR device in waffle layout for RF ESD protection. In 2007 IEEE International Conference on Microelectronic Test Structures, ICMTS - Conference Proceedings. 2007. p. 196-199. 4252432. (IEEE International Conference on Microelectronic Test Structures). https://doi.org/10.1109/ICMTS.2007.374482
Ker, Ming Dou ; Lin, Chun Yu. / Test structure on SCR device in waffle layout for RF ESD protection. 2007 IEEE International Conference on Microelectronic Test Structures, ICMTS - Conference Proceedings. 2007. pp. 196-199 (IEEE International Conference on Microelectronic Test Structures).
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