Temperature dependence of tunneling spectroscopy in epitaxial thin film Pr0.5Sr0.5MnO3

B. C. Yao, J. B. Lee, C. C. Chi, M. K. Wu, H. C. Yang

    Research output: Contribution to journalArticle

    5 Citations (Scopus)

    Abstract

    We have studied the variation of the density of states (DOS) near the Fermi energy Ef of Pr0.5Sr0.5MnO3 thin film as a function of temperature using scanning tunneling microscope (STM). The tunneling spectroscopy exhibits spectral changes in the density of state across Neel temperature (TN to approximately 160 K) and Curie temperature (TC to approximately 240 K). The DOS near Ef shows strong temperature dependence.

    Original languageEnglish
    Pages (from-to)103-105
    Number of pages3
    JournalJournal of Magnetism and Magnetic Materials
    Volume209
    Issue number1-3
    DOIs
    Publication statusPublished - 2000 Jan 1

    Fingerprint

    Epitaxial films
    Spectroscopy
    Thin films
    Neel temperature
    temperature dependence
    Curie temperature
    thin films
    Fermi level
    spectroscopy
    Microscopes
    neel temperature
    Scanning
    Temperature
    microscopes
    scanning
    temperature
    energy

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics

    Cite this

    Temperature dependence of tunneling spectroscopy in epitaxial thin film Pr0.5Sr0.5MnO3 . / Yao, B. C.; Lee, J. B.; Chi, C. C.; Wu, M. K.; Yang, H. C.

    In: Journal of Magnetism and Magnetic Materials, Vol. 209, No. 1-3, 01.01.2000, p. 103-105.

    Research output: Contribution to journalArticle

    Yao, B. C. ; Lee, J. B. ; Chi, C. C. ; Wu, M. K. ; Yang, H. C. / Temperature dependence of tunneling spectroscopy in epitaxial thin film Pr0.5Sr0.5MnO3 In: Journal of Magnetism and Magnetic Materials. 2000 ; Vol. 209, No. 1-3. pp. 103-105.
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    AU - Lee, J. B.

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    AU - Wu, M. K.

    AU - Yang, H. C.

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