Surface roughness measurement on microchannels by atomic force microscopy using a bent tapered fiber probe

Sy Hann Chen, Heh Nan Lin*, Chii Ron Yang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Surface roughness measurement on microchannels by atomic force microscopy using a bent tapered fiber probe'. Together they form a unique fingerprint.

Chemistry

INIS

Physics