Surface modification of YBa2Cu3Oy thin films with a scanning tunneling microscope

Sufen Chen; L. M. Wang; W. B. Jian; S. Y. Wang; H. C. Yang; H. E. Horng

doi:10.1063/1.357566

Surface modification of YBa₂Cu₃O_y thin films with a scanning tunneling microscope

Sufen Chen^*, L. M. Wang, W. B. Jian, S. Y. Wang, H. C. Yang, H. E. Horng

^*Corresponding author for this work

Undergraduate Program of Electro-Optical Engineering

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

We report a systematic modification of thin YBa₂Cu ₃O_y films with a scanning tunneling microscope. The samples include YBa₂Cu₃O_y films on MgO(001) and YBa₂Cu₃O_y/PrBa₂Cu₃O _y bilayer films on SrTiO₃ (001). The bias voltage of the tip was kept negative and varied from -600 to -1200 mV. The tip was operated in a constant tunneling current mode with tunneling current 0.3-0.7 nA and scanning rate 1 Hz. Modification of the surface begins with nucleation of holes, or at the edge of a dislocation or protrusion on the surface, and is achieved by successively scanning a fixed area. We show the image obtained from an atomic force microscope which can help us look into the mechanism of the modification.

Original language	English
Pages (from-to)	2535-2537
Number of pages	3
Journal	Journal of Applied Physics
Volume	76
Issue number	4
DOIs	https://doi.org/10.1063/1.357566
Publication status	Published - 1994

ASJC Scopus subject areas

General Physics and Astronomy

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title = "Surface modification of YBa2Cu3Oy thin films with a scanning tunneling microscope",

abstract = "We report a systematic modification of thin YBa2Cu 3Oy films with a scanning tunneling microscope. The samples include YBa2Cu3Oy films on MgO(001) and YBa2Cu3Oy/PrBa2Cu3O y bilayer films on SrTiO3 (001). The bias voltage of the tip was kept negative and varied from -600 to -1200 mV. The tip was operated in a constant tunneling current mode with tunneling current 0.3-0.7 nA and scanning rate 1 Hz. Modification of the surface begins with nucleation of holes, or at the edge of a dislocation or protrusion on the surface, and is achieved by successively scanning a fixed area. We show the image obtained from an atomic force microscope which can help us look into the mechanism of the modification.",

author = "Sufen Chen and Wang, {L. M.} and Jian, {W. B.} and Wang, {S. Y.} and Yang, {H. C.} and Horng, {H. E.}",

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T1 - Surface modification of YBa2Cu3Oy thin films with a scanning tunneling microscope

AU - Chen, Sufen

AU - Wang, L. M.

AU - Jian, W. B.

AU - Wang, S. Y.

AU - Yang, H. C.

AU - Horng, H. E.

PY - 1994

Y1 - 1994

N2 - We report a systematic modification of thin YBa2Cu 3Oy films with a scanning tunneling microscope. The samples include YBa2Cu3Oy films on MgO(001) and YBa2Cu3Oy/PrBa2Cu3O y bilayer films on SrTiO3 (001). The bias voltage of the tip was kept negative and varied from -600 to -1200 mV. The tip was operated in a constant tunneling current mode with tunneling current 0.3-0.7 nA and scanning rate 1 Hz. Modification of the surface begins with nucleation of holes, or at the edge of a dislocation or protrusion on the surface, and is achieved by successively scanning a fixed area. We show the image obtained from an atomic force microscope which can help us look into the mechanism of the modification.

AB - We report a systematic modification of thin YBa2Cu 3Oy films with a scanning tunneling microscope. The samples include YBa2Cu3Oy films on MgO(001) and YBa2Cu3Oy/PrBa2Cu3O y bilayer films on SrTiO3 (001). The bias voltage of the tip was kept negative and varied from -600 to -1200 mV. The tip was operated in a constant tunneling current mode with tunneling current 0.3-0.7 nA and scanning rate 1 Hz. Modification of the surface begins with nucleation of holes, or at the edge of a dislocation or protrusion on the surface, and is achieved by successively scanning a fixed area. We show the image obtained from an atomic force microscope which can help us look into the mechanism of the modification.

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Surface modification of YBa₂Cu₃O_y thin films with a scanning tunneling microscope

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