Surface modification of YBa 2 Cu 3 O y thin films with a scanning tunneling microscope

Sufen Chen, L. M. Wang, W. B. Jian, S. Y. Wang, Hong-Chang Yang, Herng-Er Horng

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Abstract

We report a systematic modification of thin YBa 2 Cu 3 O y films with a scanning tunneling microscope. The samples include YBa 2 Cu 3 O y films on MgO(001) and YBa 2 Cu 3 O y /PrBa 2 Cu 3 O y bilayer films on SrTiO 3 (001). The bias voltage of the tip was kept negative and varied from -600 to -1200 mV. The tip was operated in a constant tunneling current mode with tunneling current 0.3-0.7 nA and scanning rate 1 Hz. Modification of the surface begins with nucleation of holes, or at the edge of a dislocation or protrusion on the surface, and is achieved by successively scanning a fixed area. We show the image obtained from an atomic force microscope which can help us look into the mechanism of the modification.

Original languageEnglish
Pages (from-to)2535-2537
Number of pages3
JournalJournal of Applied Physics
Volume76
Issue number4
DOIs
Publication statusPublished - 1994 Dec 1

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Surface modification of YBa 2 Cu 3 O y thin films with a scanning tunneling microscope . / Chen, Sufen; Wang, L. M.; Jian, W. B.; Wang, S. Y.; Yang, Hong-Chang; Horng, Herng-Er.

In: Journal of Applied Physics, Vol. 76, No. 4, 01.12.1994, p. 2535-2537.

Research output: Contribution to journalArticle

Chen, Sufen ; Wang, L. M. ; Jian, W. B. ; Wang, S. Y. ; Yang, Hong-Chang ; Horng, Herng-Er. / Surface modification of YBa 2 Cu 3 O y thin films with a scanning tunneling microscope In: Journal of Applied Physics. 1994 ; Vol. 76, No. 4. pp. 2535-2537.
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