Superlattice HfO2-ZrO2based Ferro-Stack HfZrO2FeFETs: Homogeneous-Domain Merits Ultra-Low Error, Low Programming Voltage 4 V and Robust Endurance 109cycles for Multibit NVM

C. Y. Liao, Z. F. Lou, C. Y. Lin, A. Senapati, R. Karmakar, K. Y. Hsiang, Z. X. Li, W. C. Ray, J. Y. Lee, P. H. Chen, F. S. Chang, H. H. Tseng, C. C. Wang, J. H. Tsai, Y. T. Tang, S. T. Chang, C. W. Liu, S. Maikap*, M. H. Lee*

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Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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