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Substrate current verifying lateral electrical field under forward substrate biases for nMOSFETs
Heng Sheng Huang, Mu Chun Wang*, Zhen Ying Hsieh, Shuang Yuan Chen, Ai Erh Chuang, Chuan Hsi Liu
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
2
Citations
(Scopus)