Sub-pixel edge detection of LED probes based on partial area effect

Chung Yen Su, Li An Yu, Nai Kuei Chen, Jheng Jyun Wang, Ying Hao Liu, Shuen De Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

In recent years, the demands for LED are increasing. For testing the quality of LEDs, a lot of LED probes are necessary, so the high precision and efficient methods are paid more attention by industrial applications. This paper is focused on the measurement of the angle and the radius of a LED probe by computer vision. In previous paper, we proposed an effective method based on Canny edge detection and curve fitting method with iteration. In this paper we add a new sub-pixel edge detection method: partial area effect. We improve the preciseness of angle from error 2.3% to 1.43% and enhance the accuracy of radius more than 30%.

Original languageEnglish
Title of host publicationProceedings of the 2015 1st International Conference on Industrial Networks and Intelligent Systems, INISCom 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages139-144
Number of pages6
ISBN (Electronic)9781631900228
DOIs
Publication statusPublished - 2015 Jul 14
Event1st International Conference on Industrial Networks and Intelligent Systems, INISCom 2015 - Tokyo, Japan
Duration: 2015 Mar 22015 Mar 4

Publication series

NameProceedings of the 2015 1st International Conference on Industrial Networks and Intelligent Systems, INISCom 2015

Other

Other1st International Conference on Industrial Networks and Intelligent Systems, INISCom 2015
CountryJapan
CityTokyo
Period15/3/215/3/4

Keywords

  • Edge detection
  • LED
  • Probe
  • Sub-pixel edge detection

ASJC Scopus subject areas

  • Artificial Intelligence
  • Computer Networks and Communications
  • Industrial and Manufacturing Engineering
  • Human-Computer Interaction

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  • Cite this

    Su, C. Y., Yu, L. A., Chen, N. K., Wang, J. J., Liu, Y. H., & Wu, S. D. (2015). Sub-pixel edge detection of LED probes based on partial area effect. In Proceedings of the 2015 1st International Conference on Industrial Networks and Intelligent Systems, INISCom 2015 (pp. 139-144). [7157835] (Proceedings of the 2015 1st International Conference on Industrial Networks and Intelligent Systems, INISCom 2015). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.4108/icst.iniscom.2015.258308