Study on ultra-fine w-EDM with on-machine measurement-assisted

Shun-Tong Chen, Hong Ye Yang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The purpose of this study was to develop the on-machine measurement techniques so as to precisely fabricate micro intricate part using ultra-fine w-EDM. The measurement-assisted approach which employs an automatic optical inspection (AOI) is incorporated to ultra-fine w-EDM process to on-machine detect the machining error for next re-machining. The AOI acquires the image through a high resolution CCD device from the contour of the workpiece after roughing in order to further process and recognize the image for determining the residual. This facilitates the on-machine error detection and compensation re-machining. The micro workpiece and electrode are not repositioned during machining. A fabrication for a micro probe of 30-μm diameter is rapidly machined and verified successfully. Based on the proposed technique, on-machine measurement with AOI has been realized satisfactorily.

Original languageEnglish
Title of host publicationInternational Conference on Advances in Materials and Processing Technologies, AMPT2010
Pages1255-1260
Number of pages6
DOIs
Publication statusPublished - 2010 Dec 1
EventInternational Conference on Advances in Materials and Processing Technologies, AMPT2010 - Paris, France
Duration: 2010 Oct 242010 Oct 27

Publication series

NameAIP Conference Proceedings
Volume1315
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

OtherInternational Conference on Advances in Materials and Processing Technologies, AMPT2010
CountryFrance
CityParis
Period10/10/2410/10/27

Fingerprint

machining
inspection
charge coupled devices
fabrication
electrodes
probes
high resolution

Keywords

  • Automatic optical inspection (AOI)
  • ultra-fine w-EDM

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Chen, S-T., & Yang, H. Y. (2010). Study on ultra-fine w-EDM with on-machine measurement-assisted. In International Conference on Advances in Materials and Processing Technologies, AMPT2010 (pp. 1255-1260). (AIP Conference Proceedings; Vol. 1315). https://doi.org/10.1063/1.3552355

Study on ultra-fine w-EDM with on-machine measurement-assisted. / Chen, Shun-Tong; Yang, Hong Ye.

International Conference on Advances in Materials and Processing Technologies, AMPT2010. 2010. p. 1255-1260 (AIP Conference Proceedings; Vol. 1315).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Chen, S-T & Yang, HY 2010, Study on ultra-fine w-EDM with on-machine measurement-assisted. in International Conference on Advances in Materials and Processing Technologies, AMPT2010. AIP Conference Proceedings, vol. 1315, pp. 1255-1260, International Conference on Advances in Materials and Processing Technologies, AMPT2010, Paris, France, 10/10/24. https://doi.org/10.1063/1.3552355
Chen S-T, Yang HY. Study on ultra-fine w-EDM with on-machine measurement-assisted. In International Conference on Advances in Materials and Processing Technologies, AMPT2010. 2010. p. 1255-1260. (AIP Conference Proceedings). https://doi.org/10.1063/1.3552355
Chen, Shun-Tong ; Yang, Hong Ye. / Study on ultra-fine w-EDM with on-machine measurement-assisted. International Conference on Advances in Materials and Processing Technologies, AMPT2010. 2010. pp. 1255-1260 (AIP Conference Proceedings).
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