@inproceedings{e8bc21a77e234cddaa232ff4d5ae94c4,
title = "Study on ultra-fine w-EDM with on-machine measurement-assisted",
abstract = "The purpose of this study was to develop the on-machine measurement techniques so as to precisely fabricate micro intricate part using ultra-fine w-EDM. The measurement-assisted approach which employs an automatic optical inspection (AOI) is incorporated to ultra-fine w-EDM process to on-machine detect the machining error for next re-machining. The AOI acquires the image through a high resolution CCD device from the contour of the workpiece after roughing in order to further process and recognize the image for determining the residual. This facilitates the on-machine error detection and compensation re-machining. The micro workpiece and electrode are not repositioned during machining. A fabrication for a micro probe of 30-μm diameter is rapidly machined and verified successfully. Based on the proposed technique, on-machine measurement with AOI has been realized satisfactorily.",
keywords = "Automatic optical inspection (AOI), ultra-fine w-EDM",
author = "Shun-Tong Chen and Yang, {Hong Ye}",
year = "2010",
month = dec
day = "1",
doi = "10.1063/1.3552355",
language = "English",
isbn = "9780735408715",
series = "AIP Conference Proceedings",
pages = "1255--1260",
booktitle = "International Conference on Advances in Materials and Processing Technologies, AMPT2010",
note = "International Conference on Advances in Materials and Processing Technologies, AMPT2010 ; Conference date: 24-10-2010 Through 27-10-2010",
}