Study of the sputtered MgB2 film on Al2O3 by X-ray absorption spectroscopy

Liang Yann Wu, Chu Nan Chang, Chi Hsiang Hsieh, Bin Jou Huang, Hong Chang Yang, Jin Ming Chen

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Abstract

In our laboratory we successfully produced thin films on Al 2O3 by sputtering a target, which is made of a mixture of MgB2 (commercial powder) and Mg, and went post-annealing process under different conditions. However, the films were not axial oriented and their superconductivity was not as great as MgB2 powders. We study the B and Mg K-edge absorption spectra and find followings: 1. The sputtered film (before ex situ annealing treatment) contains small amount of B 2O3 due to residual oxygen in the vacuum chamber, and unknown Mg compound. No signal of MgO is observed. 2. Under annealing temperature at 900°C, B2O3 is reduced to B by reacting with Mg and MgO is formed. No superconductivity was found. 3. Under annealing temperature at 600° ∼ 700°C, the Tc increases from 11.5 K to 25.5 K. The chemical shift of the pre-edge of the Mg K-absorption edge is greater as compared with that of MgB2 powder (Tc = 39 K). The Mg K-absorption spectrum indicates that the sample contains some amount of MgO.

Original languageEnglish
Pages (from-to)534-542
Number of pages9
JournalChinese Journal of Physics
Volume42
Issue number4 II
Publication statusPublished - 2004 Aug 1

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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    Wu, L. Y., Chang, C. N., Hsieh, C. H., Huang, B. J., Yang, H. C., & Chen, J. M. (2004). Study of the sputtered MgB2 film on Al2O3 by X-ray absorption spectroscopy. Chinese Journal of Physics, 42(4 II), 534-542.