Study of micro-electro discharge machining (micro-EDM) with on-machine measurement-assisted techniques

Shun Tong Chen, Hong Ye Yang

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

In this study on-machine measurement-assisted techniques are utilized in combination with micro-EDM to successfully machine intricate micro-parts. Two measurement approaches, automatic optical inspection (AOI) and critical contact measurement (CCM), are used on a previously built machine tool. AOI acquires the image from the contour of the machined workpiece and further processes the image to determine the finish allowance. CCM measures on-line the consumption of the microelectrode to create an accurate compensation rate. These two non-contact measurement techniques facilitate on-machine error detection and re-machining during micro-EDM. Significant work efficiency and preservation of machining accuracy are gained by having the workpiece and tool remain in place throughout machining procedures. A micro-probe with a diameter of 30 νm and a micro 3D engraving mold on a small tungsten steel ball are perfectly fabricated and verified, respectively.

Original languageEnglish
Article number065702
JournalMeasurement Science and Technology
Volume22
Issue number6
DOIs
Publication statusPublished - 2011 Jun

Fingerprint

Electric discharge machining
Machining
machining
Inspection
inspection
engraving
Contact
Non-contact Measurement
machine tools
Error Detection
Microelectrodes
Machine Tool
Measurement Techniques
Error detection
allowances
Machine tools
Preservation
Tungsten
balls
Steel

Keywords

  • automatic optical inspection (AOI)
  • critical contact measurement (CCM)
  • micro-EDMilling
  • ultra-fine w-EDM

ASJC Scopus subject areas

  • Instrumentation
  • Engineering (miscellaneous)
  • Applied Mathematics

Cite this

Study of micro-electro discharge machining (micro-EDM) with on-machine measurement-assisted techniques. / Chen, Shun Tong; Yang, Hong Ye.

In: Measurement Science and Technology, Vol. 22, No. 6, 065702, 06.2011.

Research output: Contribution to journalArticle

@article{971d85bb2d3847a8b29171af6c90a72b,
title = "Study of micro-electro discharge machining (micro-EDM) with on-machine measurement-assisted techniques",
abstract = "In this study on-machine measurement-assisted techniques are utilized in combination with micro-EDM to successfully machine intricate micro-parts. Two measurement approaches, automatic optical inspection (AOI) and critical contact measurement (CCM), are used on a previously built machine tool. AOI acquires the image from the contour of the machined workpiece and further processes the image to determine the finish allowance. CCM measures on-line the consumption of the microelectrode to create an accurate compensation rate. These two non-contact measurement techniques facilitate on-machine error detection and re-machining during micro-EDM. Significant work efficiency and preservation of machining accuracy are gained by having the workpiece and tool remain in place throughout machining procedures. A micro-probe with a diameter of 30 νm and a micro 3D engraving mold on a small tungsten steel ball are perfectly fabricated and verified, respectively.",
keywords = "automatic optical inspection (AOI), critical contact measurement (CCM), micro-EDMilling, ultra-fine w-EDM",
author = "Chen, {Shun Tong} and Yang, {Hong Ye}",
year = "2011",
month = "6",
doi = "10.1088/0957-0233/22/6/065702",
language = "English",
volume = "22",
journal = "Measurement Science and Technology",
issn = "0957-0233",
publisher = "IOP Publishing Ltd.",
number = "6",

}

TY - JOUR

T1 - Study of micro-electro discharge machining (micro-EDM) with on-machine measurement-assisted techniques

AU - Chen, Shun Tong

AU - Yang, Hong Ye

PY - 2011/6

Y1 - 2011/6

N2 - In this study on-machine measurement-assisted techniques are utilized in combination with micro-EDM to successfully machine intricate micro-parts. Two measurement approaches, automatic optical inspection (AOI) and critical contact measurement (CCM), are used on a previously built machine tool. AOI acquires the image from the contour of the machined workpiece and further processes the image to determine the finish allowance. CCM measures on-line the consumption of the microelectrode to create an accurate compensation rate. These two non-contact measurement techniques facilitate on-machine error detection and re-machining during micro-EDM. Significant work efficiency and preservation of machining accuracy are gained by having the workpiece and tool remain in place throughout machining procedures. A micro-probe with a diameter of 30 νm and a micro 3D engraving mold on a small tungsten steel ball are perfectly fabricated and verified, respectively.

AB - In this study on-machine measurement-assisted techniques are utilized in combination with micro-EDM to successfully machine intricate micro-parts. Two measurement approaches, automatic optical inspection (AOI) and critical contact measurement (CCM), are used on a previously built machine tool. AOI acquires the image from the contour of the machined workpiece and further processes the image to determine the finish allowance. CCM measures on-line the consumption of the microelectrode to create an accurate compensation rate. These two non-contact measurement techniques facilitate on-machine error detection and re-machining during micro-EDM. Significant work efficiency and preservation of machining accuracy are gained by having the workpiece and tool remain in place throughout machining procedures. A micro-probe with a diameter of 30 νm and a micro 3D engraving mold on a small tungsten steel ball are perfectly fabricated and verified, respectively.

KW - automatic optical inspection (AOI)

KW - critical contact measurement (CCM)

KW - micro-EDMilling

KW - ultra-fine w-EDM

UR - http://www.scopus.com/inward/record.url?scp=79956087442&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=79956087442&partnerID=8YFLogxK

U2 - 10.1088/0957-0233/22/6/065702

DO - 10.1088/0957-0233/22/6/065702

M3 - Article

AN - SCOPUS:79956087442

VL - 22

JO - Measurement Science and Technology

JF - Measurement Science and Technology

SN - 0957-0233

IS - 6

M1 - 065702

ER -