Structure and magnetic properties of {001} NiFe/NiMn/Co

Chih Huang Lai; Yung Hung Wang; W. C. Lien; C. K. Lo

doi:10.1109/20.908545

Structure and magnetic properties of {001} NiFe/NiMn/Co

Chih Huang Lai^*
, Yung Hung Wang
, W. C. Lien
, C. K. Lo

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

5 Citations (Scopus)

Abstract

Textured and epitaxial {001} NiFe/NiMn/Co films were grown on Cu/Si (100) structural templates by using e-beam evaporation. Numerical analysis of high-resolution TEM images was used to determine the local d-spacing of NiMn. The local c/a ratio for the annealed sample varied across the film. The well-aligned orientation relationship between NiFe and NiMn stabilized the disordered NiMn phase, which resulted in a small exchange field. Interdiffusion was observed by energy dispersive X-ray spectroscopy near the interfaces of Cu/NiFe, NiFe/NiMn, and NiMn/Co. Interdiffusion may modify the interfacial structures, and may contribute to the enhancement of the coercivity in NiFe and Co.

Original language	English
Pages (from-to)	2641-2643
Number of pages	3
Journal	IEEE Transactions on Magnetics
Volume	36
Issue number	5 I
DOIs	https://doi.org/10.1109/20.908545
Publication status	Published - 2000 Sept
Externally published	Yes
Event	2000 International Magnetics Conference (INTERMAG 2000) - Toronto, Ont, Canada Duration: 2000 Apr 9 → 2000 Apr 12

Keywords

Exchange field
High-resolution TEM
Interdiffusion
{001} NiFe/NiMn/Co

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

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10.1109/20.908545

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title = "Structure and magnetic properties of \{001\} NiFe/NiMn/Co",

abstract = "Textured and epitaxial \{001\} NiFe/NiMn/Co films were grown on Cu/Si (100) structural templates by using e-beam evaporation. Numerical analysis of high-resolution TEM images was used to determine the local d-spacing of NiMn. The local c/a ratio for the annealed sample varied across the film. The well-aligned orientation relationship between NiFe and NiMn stabilized the disordered NiMn phase, which resulted in a small exchange field. Interdiffusion was observed by energy dispersive X-ray spectroscopy near the interfaces of Cu/NiFe, NiFe/NiMn, and NiMn/Co. Interdiffusion may modify the interfacial structures, and may contribute to the enhancement of the coercivity in NiFe and Co.",

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note = "Funding Information: Manuscript received January 29, 2000. This work was supported by National Science Council of ROC under Grants NSC. 89-2112-M-007-031. C.-H. Lai, Y.-H. Wang, and W. C. Lien are with the Department of Materials Science and Engineering, National Tsing Hua University, 300 HsinChu, Taiwan, R. O. C. C. K. Lo is with the Opto-Electronics \& Sys. Lab, Industrial Technology Research Institute, Chuntung, Taiwan, R. O. C. Publisher Item Identifier S 0018-9464(00)08955-X.; 2000 International Magnetics Conference (INTERMAG 2000) ; Conference date: 09-04-2000 Through 12-04-2000",

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AU - Lai, Chih Huang

AU - Wang, Yung Hung

AU - Lien, W. C.

AU - Lo, C. K.

N1 - Funding Information: Manuscript received January 29, 2000. This work was supported by National Science Council of ROC under Grants NSC. 89-2112-M-007-031. C.-H. Lai, Y.-H. Wang, and W. C. Lien are with the Department of Materials Science and Engineering, National Tsing Hua University, 300 HsinChu, Taiwan, R. O. C. C. K. Lo is with the Opto-Electronics & Sys. Lab, Industrial Technology Research Institute, Chuntung, Taiwan, R. O. C. Publisher Item Identifier S 0018-9464(00)08955-X.

PY - 2000/9

Y1 - 2000/9

N2 - Textured and epitaxial {001} NiFe/NiMn/Co films were grown on Cu/Si (100) structural templates by using e-beam evaporation. Numerical analysis of high-resolution TEM images was used to determine the local d-spacing of NiMn. The local c/a ratio for the annealed sample varied across the film. The well-aligned orientation relationship between NiFe and NiMn stabilized the disordered NiMn phase, which resulted in a small exchange field. Interdiffusion was observed by energy dispersive X-ray spectroscopy near the interfaces of Cu/NiFe, NiFe/NiMn, and NiMn/Co. Interdiffusion may modify the interfacial structures, and may contribute to the enhancement of the coercivity in NiFe and Co.

AB - Textured and epitaxial {001} NiFe/NiMn/Co films were grown on Cu/Si (100) structural templates by using e-beam evaporation. Numerical analysis of high-resolution TEM images was used to determine the local d-spacing of NiMn. The local c/a ratio for the annealed sample varied across the film. The well-aligned orientation relationship between NiFe and NiMn stabilized the disordered NiMn phase, which resulted in a small exchange field. Interdiffusion was observed by energy dispersive X-ray spectroscopy near the interfaces of Cu/NiFe, NiFe/NiMn, and NiMn/Co. Interdiffusion may modify the interfacial structures, and may contribute to the enhancement of the coercivity in NiFe and Co.

KW - Exchange field

KW - High-resolution TEM

KW - Interdiffusion

KW - {001} NiFe/NiMn/Co

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EP - 2643

JO - IEEE Transactions on Magnetics

JF - IEEE Transactions on Magnetics

IS - 5 I

T2 - 2000 International Magnetics Conference (INTERMAG 2000)

Y2 - 9 April 2000 through 12 April 2000

ER -

Structure and magnetic properties of {001} NiFe/NiMn/Co

Abstract

Keywords

ASJC Scopus subject areas

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