Abstract
Textured and epitaxial {001} NiFe/NiMn/Co films were grown on Cu/Si (100) structural templates by using e-beam evaporation. Numerical analysis of high-resolution TEM images was used to determine the local d-spacing of NiMn. The local c/a ratio for the annealed sample varied across the film. The well-aligned orientation relationship between NiFe and NiMn stabilized the disordered NiMn phase, which resulted in a small exchange field. Interdiffusion was observed by energy dispersive X-ray spectroscopy near the interfaces of Cu/NiFe, NiFe/NiMn, and NiMn/Co. Interdiffusion may modify the interfacial structures, and may contribute to the enhancement of the coercivity in NiFe and Co.
Original language | English |
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Pages (from-to) | 2641-2643 |
Number of pages | 3 |
Journal | IEEE Transactions on Magnetics |
Volume | 36 |
Issue number | 5 I |
DOIs | |
Publication status | Published - 2000 Sept |
Externally published | Yes |
Event | 2000 International Magnetics Conference (INTERMAG 2000) - Toronto, Ont, Canada Duration: 2000 Apr 9 → 2000 Apr 12 |
Keywords
- Exchange field
- High-resolution TEM
- Interdiffusion
- {001} NiFe/NiMn/Co
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering