Structure and charge transport properties in MEH-PPV

Anto Regis Inigo, Hsiang Chih Chiu, Wunshain Fann*, Ying Sheng Huang, U. S. Jeng, C. H. Hsu, Kang Yung Peng, Show An Chen

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

43 Citations (Scopus)


The charge carrier transport in MEH-PPV is investigated with respect to different molecular weight distributions and with different tetrahedral defect densities. The defect density influences the charge transport behaviors significantly. With smaller defect density, MEH-PPV exhibits better charge transport which further depends upon the morphology. Position disorder parameter which is due to the morphology difference dominates the charge transport properties of low defect samples.

Original languageEnglish
Pages (from-to)581-584
Number of pages4
JournalSynthetic Metals
Issue number3
Publication statusPublished - 2003 Oct 9
Externally publishedYes
EventProceedings of the Fifth International Topical Conference - Venice, Italy
Duration: 2003 Feb 92003 Feb 14


  • Charge transport
  • Hole mobility
  • Morphology
  • TOF
  • Tetrahedral defect density

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys
  • Materials Chemistry


Dive into the research topics of 'Structure and charge transport properties in MEH-PPV'. Together they form a unique fingerprint.

Cite this