Structural, optical, and magnetic properties of highly-resistive Sm-implanted GaN thin films

Fang Yuh Lo, Cheng De Huang, Kai Chieh Chou, Jhong Yu Guo, Hsiang Lin Liu, Verena Ney, Andreas Ney, Stepan Shvarkov, Sébastien Pezzagna, Dirk Reuter, Chi Ta Chia, Ming Yau Chern, Andreas D. Wieck, Jean Massies

Research output: Contribution to journalArticle

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Abstract

Samarium ions of 200 keV in energy were implanted into highly-resistive molecular-beam-epitaxy grown GaN thin films with a focused-ion-beam implanter at room temperature. The implantation doses range from 1 × 1014 to 1 × 1016cm-2. Structural properties studied by x-ray diffraction and Raman-scattering spectroscopy revealed Sm incorporation into GaN matrix without secondary phase. The optical measurements showed that the band gap and optical constants changed very slightly by the implantation. Photoluminescence measurements showed emission spectra similar to p-type GaN for all samples. Magnetic investigations with a superconducting quantum interference device identified magnetic ordering for Sm dose of and above 1 × 1015cm-2 before thermal annealing, while ferromagnetism was only observed after thermal annealing from the sample with highest Sm dose. The long-range magnetic ordering can be attributed to interaction of Sm ions through the implantation-induced Ga vacancy.

Original languageEnglish
Article number043909
JournalJournal of Applied Physics
Volume116
Issue number4
DOIs
Publication statusPublished - 2014 Jul 28

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implantation
magnetic properties
optical properties
dosage
thin films
annealing
samarium
optical measurement
ferromagnetism
ions
emission spectra
x ray diffraction
molecular beam epitaxy
ion beams
Raman spectra
photoluminescence
interference
room temperature
matrices
spectroscopy

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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Structural, optical, and magnetic properties of highly-resistive Sm-implanted GaN thin films. / Lo, Fang Yuh; Huang, Cheng De; Chou, Kai Chieh; Guo, Jhong Yu; Liu, Hsiang Lin; Ney, Verena; Ney, Andreas; Shvarkov, Stepan; Pezzagna, Sébastien; Reuter, Dirk; Chia, Chi Ta; Chern, Ming Yau; Wieck, Andreas D.; Massies, Jean.

In: Journal of Applied Physics, Vol. 116, No. 4, 043909, 28.07.2014.

Research output: Contribution to journalArticle

Lo, FY, Huang, CD, Chou, KC, Guo, JY, Liu, HL, Ney, V, Ney, A, Shvarkov, S, Pezzagna, S, Reuter, D, Chia, CT, Chern, MY, Wieck, AD & Massies, J 2014, 'Structural, optical, and magnetic properties of highly-resistive Sm-implanted GaN thin films', Journal of Applied Physics, vol. 116, no. 4, 043909. https://doi.org/10.1063/1.4891226
Lo, Fang Yuh ; Huang, Cheng De ; Chou, Kai Chieh ; Guo, Jhong Yu ; Liu, Hsiang Lin ; Ney, Verena ; Ney, Andreas ; Shvarkov, Stepan ; Pezzagna, Sébastien ; Reuter, Dirk ; Chia, Chi Ta ; Chern, Ming Yau ; Wieck, Andreas D. ; Massies, Jean. / Structural, optical, and magnetic properties of highly-resistive Sm-implanted GaN thin films. In: Journal of Applied Physics. 2014 ; Vol. 116, No. 4.
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