Structural determination and magnetic properties for Co-rubrene composite films on Si(1 0 0)

Yong Jhih Hou, Cheng Hsun Tony Chang, Chun Kai Yang, Chih Yu Hsu, Yen Wei Jhou, Jyh Shen Tsay

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2 Citations (Scopus)

Abstract

Because of the potential uses toward low-cost and flexible-substrate-based electronics, semiconducting organic materials have attracted much attention. In this contribution, structures and magnetic properties of Co-rubrene composite films on Si(1 0 0) have been studied by employing atomic force microscopy (AFM) and magneto-optic Kerr effect techniques. For composite films prepared by co-depositions of Co and rubrene on Si(1 0 0), the surface is smooth while a layered distribution of Co atoms is detected. For thick composite films, surfactant effects of rubrene molecules cause smooth surfaces and reduced interaction at the film/Si interface. For thin composite films, the formation of separated Co clusters in the films results in a larger coercive force due to the imperfection introduced by rough interface to impede the magnetization reversal. By increasing the rubrene concentration, more Co/rubrene interfaces are introduced in the composite films and the more rubrene served as a surfactant enhances the quality of the films. These information are valuable for future applications combining organic semiconductor and spintronics.

Original languageEnglish
Pages (from-to)139-143
Number of pages5
JournalApplied Surface Science
Volume354
DOIs
Publication statusPublished - 2015 Nov 1

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Keywords

  • Atomic force microscopy
  • Cobalt
  • Magneto-optic Kerr effect
  • Magnetron sputtering
  • Rubrene

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Physics and Astronomy(all)
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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