Strained pMOSFETs with SiGe channel and embedded SiGe source/drain stressor under heating and hot-carrier stresses

Mu Chun Wang, Min Ru Peng, Liang Ru Ji, Heng Sheng Huang, Shuang Yuan Chen, Shea Jue Wang, Hong Wen Hsu, Wen Shiang Liao, Chuan-Hsi Liu

Research output: Contribution to conferencePaperpeer-review

1 Citation (Scopus)

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Engineering & Materials Science