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Strained pMOSFETs with SiGe channel and embedded SiGe source/drain stressor under heating and hot-carrier stresses
Mu Chun Wang, Min Ru Peng, Liang Ru Ji, Heng Sheng Huang, Shuang Yuan Chen, Shea Jue Wang*, Hong Wen Hsu, Wen Shiang Liao, Chuan Hsi Liu
*Corresponding author for this work
Research output: Contribution to conference › Paper › peer-review
2
Citations
(Scopus)