Strained pMOSFETs with SiGe channel and embedded SiGe source/drain stressor under heating and hot-carrier stresses

Mu Chun Wang, Min Ru Peng, Liang Ru Ji, Heng Sheng Huang, Shuang Yuan Chen, Shea Jue Wang*, Hong Wen Hsu, Wen Shiang Liao, Chuan Hsi Liu

*Corresponding author for this work

Research output: Contribution to conferencePaperpeer-review

2 Citations (Scopus)

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Engineering & Materials Science