Stacking fault induced tunnel barrier in platelet graphite nanofiber

Yann Wen Lan, Wen Hao Chang, Yuan Yao Li, Yuan Chih Chang, Chia Seng Chang, Chii Dong Chen

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3 Citations (Scopus)

Abstract

A correlation study using image inspection and electrical characterization of platelet graphite nanofiber devices is conducted. Close transmission electron microscopy and diffraction pattern inspection reveal layers with inflection angles appearing in otherwise perfectly stacked graphene platelets, separating nanofibers into two domains. Electrical measurement gives a stability diagram consisting of alternating small-large Coulomb blockade diamonds, suggesting that there are two charging islands coupled together through a tunnel junction. Based on these two findings, we propose that a stacking fault can behave as a tunnel barrier for conducting electrons and is responsible for the observed double-island single electron transistor characteristics.

Original languageEnglish
Article number103505
JournalApplied Physics Letters
Volume105
Issue number10
DOIs
Publication statusPublished - 2014 Sep 8
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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  • Cite this

    Lan, Y. W., Chang, W. H., Li, Y. Y., Chang, Y. C., Chang, C. S., & Chen, C. D. (2014). Stacking fault induced tunnel barrier in platelet graphite nanofiber. Applied Physics Letters, 105(10), [103505]. https://doi.org/10.1063/1.4895787