Spectroscopic characterization of Ba(Mg1/3Ta2/3) O3 dielectrics for the application to microwave communication

H. F. Cheng; C. T. Chia; H. L. Liu; M. Y. Chen; Y. T. Tzeng; I. N. Lin

doi:10.1163/156939307780667292

Spectroscopic characterization of Ba(Mg_1/3Ta_2/3) O₃ dielectrics for the application to microwave communication

H. F. Cheng, C. T. Chia, H. L. Liu, M. Y. Chen, Y. T. Tzeng, I. N. Lin

Department of Physics

Research output: Contribution to journal › Article

6 Citations (Scopus)

Abstract

The lattice vibrational modes of the Ba(Mg_1/3Ta _2/3)O₃ materials, possessing dielectric constants K = 22.2 - 25.5 and quality factor Q × f = 182, 600 - 248, 000 GHz, were characterized by Raman and FTIR spectroscopies. The high-Q materials possess sharpest vibrational modes, viz., smallest full-width-at-half-maximum (FWHM) value for Raman peaks and smallest damping coefficient 7, value for FTIR peaks and vice versa.

Original language	English
Pages (from-to)	629-636
Number of pages	8
Journal	Journal of Electromagnetic Waves and Applications
Volume	21
Issue number	5
DOIs	https://doi.org/10.1163/156939307780667292
Publication status	Published - 2007 Apr 11

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ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Physics and Astronomy(all)
Electrical and Electronic Engineering

Cite this

Cheng, H. F., Chia, C. T., Liu, H. L., Chen, M. Y., Tzeng, Y. T., & Lin, I. N. (2007). Spectroscopic characterization of Ba(Mg_1/3Ta_2/3) O₃ dielectrics for the application to microwave communication. Journal of Electromagnetic Waves and Applications, 21(5), 629-636. https://doi.org/10.1163/156939307780667292

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AU - Chen, M. Y.

AU - Tzeng, Y. T.

AU - Lin, I. N.

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10.1163/156939307780667292