TY - JOUR
T1 - Spatial recognition of a superconducting quantum interference devices nondestructive evaluation system using a small room-temperature probe
AU - Chieh, Jen Jie
AU - Lin, I. Sheng
AU - Yang, Shieh Yueh
AU - Horng, Herng Er
AU - Hong, Chin Yih
AU - Yang, Hong Chang
PY - 2009/12
Y1 - 2009/12
N2 - A superconducting-qantum-interference-device (SQUID) nondestructive evaluation (NDE) system using a small room-temperature probe is developed for active scanning rather than for a massive movement occurring in a traditional SQUID NDE system. The small roomtemperature probe is composed of a quadruple excitation coil and a double D-shaped pickup coil. It is connected to the input coil surrounding a high-Tc rf SQUID, immersed in liquid nitrogen, and shielded by a shielding can. Beyond the NDE function, the SQUID NDE scheme has spatial recognition functions, including the detection of the orientation and depth of a narrow line crack using different parameters, and the scanning of images of large objects with arbitrary shapes. Furthermore, the spatial sensitivity, limited by the size of the probe, reaches up to only 7 μm in the aspect of crack widths and 1mm in the aspect of spatial intervals for precision NDE on a printed circuit board.
AB - A superconducting-qantum-interference-device (SQUID) nondestructive evaluation (NDE) system using a small room-temperature probe is developed for active scanning rather than for a massive movement occurring in a traditional SQUID NDE system. The small roomtemperature probe is composed of a quadruple excitation coil and a double D-shaped pickup coil. It is connected to the input coil surrounding a high-Tc rf SQUID, immersed in liquid nitrogen, and shielded by a shielding can. Beyond the NDE function, the SQUID NDE scheme has spatial recognition functions, including the detection of the orientation and depth of a narrow line crack using different parameters, and the scanning of images of large objects with arbitrary shapes. Furthermore, the spatial sensitivity, limited by the size of the probe, reaches up to only 7 μm in the aspect of crack widths and 1mm in the aspect of spatial intervals for precision NDE on a printed circuit board.
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U2 - 10.1143/JJAP.48.126506
DO - 10.1143/JJAP.48.126506
M3 - Article
AN - SCOPUS:75149184898
SN - 0021-4922
VL - 48
JO - Japanese Journal of Applied Physics
JF - Japanese Journal of Applied Physics
IS - 12
M1 - 126506
ER -