Simulation of the magnetic field due to defects and verification using high-Tc SQUID

J. T. Jeng; H. E. Horng; H. C. Yang; J. C. Chen; J. H. Chen

doi:10.1016/S0921-4534(01)01019-X

Simulation of the magnetic field due to defects and verification using high-T_c SQUID

J. T. Jeng, H. E. Horng^*, H. C. Yang, J. C. Chen, J. H. Chen

^*Corresponding author for this work

Undergraduate Program of Electro-Optical Engineering

Research output: Contribution to journal › Article › peer-review

10 Citations (Scopus)

Abstract

The defect field due to a flaw in the conducting slab is studied numerically and experimentally in this report. It was found that the magnitude of the defect field exhibits a nearly exponential decrease with the increasing flaw depth, and the phase of the defect field shows a linear dependence on the flaw depth. The calculated defect field was compared with the results measured by using a high-T_c SQUID.

Original language	English
Pages (from-to)	298-302
Number of pages	5
Journal	Physica C: Superconductivity and its applications
Volume	367
Issue number	1-4
DOIs	https://doi.org/10.1016/S0921-4534(01)01019-X
Publication status	Published - 2002 Feb 15

Keywords

Defect field
Eddy current
Non-destructive evaluation
SQUID

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Energy Engineering and Power Technology
Electrical and Electronic Engineering

Access to Document

10.1016/S0921-4534(01)01019-X

Cite this

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title = "Simulation of the magnetic field due to defects and verification using high-Tc SQUID",

abstract = "The defect field due to a flaw in the conducting slab is studied numerically and experimentally in this report. It was found that the magnitude of the defect field exhibits a nearly exponential decrease with the increasing flaw depth, and the phase of the defect field shows a linear dependence on the flaw depth. The calculated defect field was compared with the results measured by using a high-Tc SQUID.",

keywords = "Defect field, Eddy current, Non-destructive evaluation, SQUID",

author = "Jeng, {J. T.} and Horng, {H. E.} and Yang, {H. C.} and Chen, {J. C.} and Chen, {J. H.}",

note = "Funding Information: This work is supported by the National Science Council of ROC under grant nos. NSC89-2112-M-003-040 and NSC89-2112-M-002-071. ",

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T1 - Simulation of the magnetic field due to defects and verification using high-Tc SQUID

AU - Jeng, J. T.

AU - Horng, H. E.

AU - Yang, H. C.

AU - Chen, J. C.

AU - Chen, J. H.

N1 - Funding Information: This work is supported by the National Science Council of ROC under grant nos. NSC89-2112-M-003-040 and NSC89-2112-M-002-071.

PY - 2002/2/15

Y1 - 2002/2/15

N2 - The defect field due to a flaw in the conducting slab is studied numerically and experimentally in this report. It was found that the magnitude of the defect field exhibits a nearly exponential decrease with the increasing flaw depth, and the phase of the defect field shows a linear dependence on the flaw depth. The calculated defect field was compared with the results measured by using a high-Tc SQUID.

AB - The defect field due to a flaw in the conducting slab is studied numerically and experimentally in this report. It was found that the magnitude of the defect field exhibits a nearly exponential decrease with the increasing flaw depth, and the phase of the defect field shows a linear dependence on the flaw depth. The calculated defect field was compared with the results measured by using a high-Tc SQUID.

KW - Defect field

KW - Eddy current

KW - Non-destructive evaluation

KW - SQUID

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