Simulation of the magnetic field due to defects and verification using high-Tc SQUID

J. T. Jeng, H. E. Horng, H. C. Yang, J. C. Chen, J. H. Chen

    Research output: Contribution to journalArticlepeer-review

    8 Citations (Scopus)

    Abstract

    The defect field due to a flaw in the conducting slab is studied numerically and experimentally in this report. It was found that the magnitude of the defect field exhibits a nearly exponential decrease with the increasing flaw depth, and the phase of the defect field shows a linear dependence on the flaw depth. The calculated defect field was compared with the results measured by using a high-Tc SQUID.

    Original languageEnglish
    Pages (from-to)298-302
    Number of pages5
    JournalPhysica C: Superconductivity and its applications
    Volume367
    Issue number1-4
    DOIs
    Publication statusPublished - 2002 Feb 15

    Keywords

    • Defect field
    • Eddy current
    • Non-destructive evaluation
    • SQUID

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics
    • Energy Engineering and Power Technology
    • Electrical and Electronic Engineering

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