Simulation of the magnetic field due to defects and verification using high-Tc SQUID

J. T. Jeng, H. E. Horng, H. C. Yang, J. C. Chen, J. H. Chen

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

The defect field due to a flaw in the conducting slab is studied numerically and experimentally in this report. It was found that the magnitude of the defect field exhibits a nearly exponential decrease with the increasing flaw depth, and the phase of the defect field shows a linear dependence on the flaw depth. The calculated defect field was compared with the results measured by using a high-Tc SQUID.

Original languageEnglish
Pages (from-to)298-302
Number of pages5
JournalPhysica C: Superconductivity and its applications
Volume367
Issue number1-4
DOIs
Publication statusPublished - 2002 Feb 15

Keywords

  • Defect field
  • Eddy current
  • Non-destructive evaluation
  • SQUID

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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