SIMS and MOKE studies of Fe/Gd multilayers on Si

Li Shing Hsu; C. K. Lo; Y. D. Yao; C. S. Yang

doi:10.1557/proc-427-65

SIMS and MOKE studies of Fe/Gd multilayers on Si

Li Shing Hsu^*, C. K. Lo, Y. D. Yao, C. S. Yang

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

1 Citation (Scopus)

Abstract

Two Fe/Gd/Fe/Gd multilayers with different layer thicknesses were grown on Si (100) by magnetron sputtering. The as-deposited samples were vacuum-annealed at 100 °C, 200 °C, and 300 °C. They were studied by grazing incidence x-ray diffraction (XRD), secondary ion mass spectroscopy (SIMS), vibrating sample magnetometer (VSM) and magneto-optical Kerr effect (MOKE). The deposition rates for Fe and for Gd are (1-2) and 4 angstroms s^-1, respectively. The XRD and SIMS data show that interdiffusion occurs between Fe and Gd layers, and between Gd and Si layers. The thicker multilayers show strong in-plane uniaxial anisotropy.

Original language	English
Pages (from-to)	65-70
Number of pages	6
Journal	Materials Research Society Symposium - Proceedings
Volume	427
DOIs	https://doi.org/10.1557/proc-427-65
Publication status	Published - 1996
Externally published	Yes
Event	Proceedings of the 1996 MRS Spring Symposium - San Francisco, CA, USA Duration: 1996 Apr 8 → 1996 Apr 12

ASJC Scopus subject areas

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

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@article{cf321a3554d94b84a75c9742ca0bc8a6,

title = "SIMS and MOKE studies of Fe/Gd multilayers on Si",

abstract = "Two Fe/Gd/Fe/Gd multilayers with different layer thicknesses were grown on Si (100) by magnetron sputtering. The as-deposited samples were vacuum-annealed at 100 °C, 200 °C, and 300 °C. They were studied by grazing incidence x-ray diffraction (XRD), secondary ion mass spectroscopy (SIMS), vibrating sample magnetometer (VSM) and magneto-optical Kerr effect (MOKE). The deposition rates for Fe and for Gd are (1-2) and 4 angstroms s-1, respectively. The XRD and SIMS data show that interdiffusion occurs between Fe and Gd layers, and between Gd and Si layers. The thicker multilayers show strong in-plane uniaxial anisotropy.",

author = "Hsu, {Li Shing} and Lo, {C. K.} and Yao, {Y. D.} and Yang, {C. S.}",

year = "1996",

doi = "10.1557/proc-427-65",

language = "English",

volume = "427",

pages = "65--70",

journal = "Materials Research Society Symposium - Proceedings",

issn = "0272-9172",

publisher = "Materials Research Society",

note = "Proceedings of the 1996 MRS Spring Symposium ; Conference date: 08-04-1996 Through 12-04-1996",

}

TY - JOUR

T1 - SIMS and MOKE studies of Fe/Gd multilayers on Si

AU - Hsu, Li Shing

AU - Lo, C. K.

AU - Yao, Y. D.

AU - Yang, C. S.

PY - 1996

Y1 - 1996

N2 - Two Fe/Gd/Fe/Gd multilayers with different layer thicknesses were grown on Si (100) by magnetron sputtering. The as-deposited samples were vacuum-annealed at 100 °C, 200 °C, and 300 °C. They were studied by grazing incidence x-ray diffraction (XRD), secondary ion mass spectroscopy (SIMS), vibrating sample magnetometer (VSM) and magneto-optical Kerr effect (MOKE). The deposition rates for Fe and for Gd are (1-2) and 4 angstroms s-1, respectively. The XRD and SIMS data show that interdiffusion occurs between Fe and Gd layers, and between Gd and Si layers. The thicker multilayers show strong in-plane uniaxial anisotropy.

AB - Two Fe/Gd/Fe/Gd multilayers with different layer thicknesses were grown on Si (100) by magnetron sputtering. The as-deposited samples were vacuum-annealed at 100 °C, 200 °C, and 300 °C. They were studied by grazing incidence x-ray diffraction (XRD), secondary ion mass spectroscopy (SIMS), vibrating sample magnetometer (VSM) and magneto-optical Kerr effect (MOKE). The deposition rates for Fe and for Gd are (1-2) and 4 angstroms s-1, respectively. The XRD and SIMS data show that interdiffusion occurs between Fe and Gd layers, and between Gd and Si layers. The thicker multilayers show strong in-plane uniaxial anisotropy.

UR - http://www.scopus.com/inward/record.url?scp=0030397918&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0030397918&partnerID=8YFLogxK

U2 - 10.1557/proc-427-65

DO - 10.1557/proc-427-65

M3 - Conference article

AN - SCOPUS:0030397918

SN - 0272-9172

VL - 427

SP - 65

EP - 70

JO - Materials Research Society Symposium - Proceedings

JF - Materials Research Society Symposium - Proceedings

T2 - Proceedings of the 1996 MRS Spring Symposium

Y2 - 8 April 1996 through 12 April 1996

ER -

SIMS and MOKE studies of Fe/Gd multilayers on Si

Abstract

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