Si-capping thicknesses impacting compressive strained MOSFETs with temperature effect
- Mu Chun Wang
- , Ssu Hao Peng
- , Shea Jue Wang*
- , Hsin Chia Yang
- , Wen Shiang Liao
- , Chao Wang Li
- , Chuan Hsi Liu
*Corresponding author for this work
Research output: Contribution to conference › Paper › peer-review