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Si-capping thicknesses impacting compressive strained MOSFETs with temperature effect
Mu Chun Wang, Ssu Hao Peng, Shea Jue Wang*, Hsin Chia Yang, Wen Shiang Liao, Chao Wang Li, Chuan Hsi Liu
*Corresponding author for this work
Research output: Contribution to conference › Paper › peer-review