Self-matched ESD cell in CMOS technology for 60-GHz broadband RF applications

Chun Yu Lin; Li Wei Chu; Ming Dou Ker; Tse Hua Lu; Ping Fang Hung; Hsiao Chun Li

doi:10.1109/RFIC.2010.5477291

Self-matched ESD cell in CMOS technology for 60-GHz broadband RF applications

Chun Yu Lin^*, Li Wei Chu, Ming Dou Ker, Tse Hua Lu, Ping Fang Hung, Hsiao Chun Li

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

14 Citations (Scopus)

Abstract

A self-matched ESD cell library has been implemented in a commercial sub-100nm CMOS process for 60-GHz broadband RF applications. This ESD cell library has reached the 50-Ω input/output matching to reduce the design complexity for RF circuit designer and to provide suitable electrostatic discharge (ESD) protection. Experimental results of this ESD cell library have successfully verified the ESD robustness and the RF characteristics in the 60-GHz frequency band. This self-matched ESD cell library is easily to be used for ESD protection design in the 60-GHz broadband RF applications.

Original language	English
Title of host publication	Proceedings of the 2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010
Pages	573-576
Number of pages	4
DOIs	https://doi.org/10.1109/RFIC.2010.5477291
Publication status	Published - 2010
Externally published	Yes
Event	2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010 - Anaheim, CA, United States Duration: 2010 May 23 → 2010 May 25

Publication series

Name	Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium
ISSN (Print)	1529-2517

Other

Other	2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010
Country/Territory	United States
City	Anaheim, CA
Period	2010/05/23 → 2010/05/25

Keywords

60 GHz
Broadband
ESD cell
Electrostatic discharge (ESD)
V-band

ASJC Scopus subject areas

Engineering(all)

Access to Document

10.1109/RFIC.2010.5477291

Cite this

Lin, C. Y., Chu, L. W., Ker, M. D., Lu, T. H., Hung, P. F., & Li, H. C. (2010). Self-matched ESD cell in CMOS technology for 60-GHz broadband RF applications. In Proceedings of the 2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010 (pp. 573-576). [10.1109/RFIC.2010.5477291] (Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium). https://doi.org/10.1109/RFIC.2010.5477291

Self-matched ESD cell in CMOS technology for 60-GHz broadband RF applications. / Lin, Chun Yu; Chu, Li Wei; Ker, Ming Dou et al.

Proceedings of the 2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010. 2010. p. 573-576 10.1109/RFIC.2010.5477291 (Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Lin, CY, Chu, LW, Ker, MD, Lu, TH, Hung, PF & Li, HC 2010, Self-matched ESD cell in CMOS technology for 60-GHz broadband RF applications. in Proceedings of the 2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010., 10.1109/RFIC.2010.5477291, Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium, pp. 573-576, 2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010, Anaheim, CA, United States, 2010/05/23. https://doi.org/10.1109/RFIC.2010.5477291

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Self-matched ESD cell in CMOS technology for 60-GHz broadband RF applications

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Keywords

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