Self-matched ESD cell in CMOS technology for 60-GHz broadband RF applications

Chun Yu Lin, Li Wei Chu, Ming Dou Ker, Tse Hua Lu, Ping Fang Hung, Hsiao Chun Li

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Citations (Scopus)

Abstract

A self-matched ESD cell library has been implemented in a commercial sub-100nm CMOS process for 60-GHz broadband RF applications. This ESD cell library has reached the 50-Ω input/output matching to reduce the design complexity for RF circuit designer and to provide suitable electrostatic discharge (ESD) protection. Experimental results of this ESD cell library have successfully verified the ESD robustness and the RF characteristics in the 60-GHz frequency band. This self-matched ESD cell library is easily to be used for ESD protection design in the 60-GHz broadband RF applications.

Original languageEnglish
Title of host publicationProceedings of the 2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010
Pages573-576
Number of pages4
DOIs
Publication statusPublished - 2010 Jul 16
Event2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010 - Anaheim, CA, United States
Duration: 2010 May 232010 May 25

Publication series

NameDigest of Papers - IEEE Radio Frequency Integrated Circuits Symposium
ISSN (Print)1529-2517

Other

Other2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010
CountryUnited States
CityAnaheim, CA
Period10/5/2310/5/25

Fingerprint

Electrostatic discharge
Frequency bands
Networks (circuits)

Keywords

  • 60 GHz
  • Broadband
  • ESD cell
  • Electrostatic discharge (ESD)
  • V-band

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Lin, C. Y., Chu, L. W., Ker, M. D., Lu, T. H., Hung, P. F., & Li, H. C. (2010). Self-matched ESD cell in CMOS technology for 60-GHz broadband RF applications. In Proceedings of the 2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010 (pp. 573-576). [10.1109/RFIC.2010.5477291] (Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium). https://doi.org/10.1109/RFIC.2010.5477291

Self-matched ESD cell in CMOS technology for 60-GHz broadband RF applications. / Lin, Chun Yu; Chu, Li Wei; Ker, Ming Dou; Lu, Tse Hua; Hung, Ping Fang; Li, Hsiao Chun.

Proceedings of the 2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010. 2010. p. 573-576 10.1109/RFIC.2010.5477291 (Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Lin, CY, Chu, LW, Ker, MD, Lu, TH, Hung, PF & Li, HC 2010, Self-matched ESD cell in CMOS technology for 60-GHz broadband RF applications. in Proceedings of the 2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010., 10.1109/RFIC.2010.5477291, Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium, pp. 573-576, 2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010, Anaheim, CA, United States, 10/5/23. https://doi.org/10.1109/RFIC.2010.5477291
Lin CY, Chu LW, Ker MD, Lu TH, Hung PF, Li HC. Self-matched ESD cell in CMOS technology for 60-GHz broadband RF applications. In Proceedings of the 2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010. 2010. p. 573-576. 10.1109/RFIC.2010.5477291. (Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium). https://doi.org/10.1109/RFIC.2010.5477291
Lin, Chun Yu ; Chu, Li Wei ; Ker, Ming Dou ; Lu, Tse Hua ; Hung, Ping Fang ; Li, Hsiao Chun. / Self-matched ESD cell in CMOS technology for 60-GHz broadband RF applications. Proceedings of the 2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010. 2010. pp. 573-576 (Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium).
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