Scanning waveform analysis of a room-temperature-probe SQUID NDE system

J. J. Chieh, I. S. Lin, H. E. Horng, Chin Yih Hong, S. Y. Yang, H. C. Yang

    Research output: Contribution to journalArticle

    1 Citation (Scopus)

    Abstract

    A room-temperature-probe SQUID NDE system with high mobility and excellent spatial resolution has been developed for detecting the internal cracks of metallic material. Here, the sensing probe is composed of quadruple excitation coils and double D-shape pickup coils. It is connected to the input coil surrounding the SQUID sensor to transfer a magnetic field of eddy current. Following the previous demonstration of its good spatial resolution and high sensitivity, a signal mechanism for the scanning waveform is further proposed in this study to explain the scanning non-directionality of the system and analyze the internal cracks. Both fine and wide single cracks and multi-cracks with dense and spare intervals are valid. Moreover, the model is in good agreement with the test results.

    Original languageEnglish
    Pages (from-to)586-590
    Number of pages5
    JournalNDT and E International
    Volume43
    Issue number7
    DOIs
    Publication statusPublished - 2010 Oct 1

    Fingerprint

    Waveform analysis
    temperature probes
    SQUIDs
    waveforms
    cracks
    Cracks
    Scanning
    coils
    scanning
    room temperature
    spatial resolution
    Temperature
    Pickups
    sensors
    Eddy currents
    eddy currents
    Demonstrations
    Magnetic fields
    intervals
    probes

    Keywords

    • Room-temperature probe
    • Superconducting quantum interference device (SQUID)
    • Waveform

    ASJC Scopus subject areas

    • Materials Science(all)
    • Condensed Matter Physics
    • Mechanical Engineering

    Cite this

    Scanning waveform analysis of a room-temperature-probe SQUID NDE system. / Chieh, J. J.; Lin, I. S.; Horng, H. E.; Hong, Chin Yih; Yang, S. Y.; Yang, H. C.

    In: NDT and E International, Vol. 43, No. 7, 01.10.2010, p. 586-590.

    Research output: Contribution to journalArticle

    Chieh, J. J. ; Lin, I. S. ; Horng, H. E. ; Hong, Chin Yih ; Yang, S. Y. ; Yang, H. C. / Scanning waveform analysis of a room-temperature-probe SQUID NDE system. In: NDT and E International. 2010 ; Vol. 43, No. 7. pp. 586-590.
    @article{4ba000b0beee447e9efc28e520ba88ce,
    title = "Scanning waveform analysis of a room-temperature-probe SQUID NDE system",
    abstract = "A room-temperature-probe SQUID NDE system with high mobility and excellent spatial resolution has been developed for detecting the internal cracks of metallic material. Here, the sensing probe is composed of quadruple excitation coils and double D-shape pickup coils. It is connected to the input coil surrounding the SQUID sensor to transfer a magnetic field of eddy current. Following the previous demonstration of its good spatial resolution and high sensitivity, a signal mechanism for the scanning waveform is further proposed in this study to explain the scanning non-directionality of the system and analyze the internal cracks. Both fine and wide single cracks and multi-cracks with dense and spare intervals are valid. Moreover, the model is in good agreement with the test results.",
    keywords = "Room-temperature probe, Superconducting quantum interference device (SQUID), Waveform",
    author = "Chieh, {J. J.} and Lin, {I. S.} and Horng, {H. E.} and Hong, {Chin Yih} and Yang, {S. Y.} and Yang, {H. C.}",
    year = "2010",
    month = "10",
    day = "1",
    doi = "10.1016/j.ndteint.2010.06.002",
    language = "English",
    volume = "43",
    pages = "586--590",
    journal = "NDT and E International",
    issn = "0963-8695",
    publisher = "Elsevier Limited",
    number = "7",

    }

    TY - JOUR

    T1 - Scanning waveform analysis of a room-temperature-probe SQUID NDE system

    AU - Chieh, J. J.

    AU - Lin, I. S.

    AU - Horng, H. E.

    AU - Hong, Chin Yih

    AU - Yang, S. Y.

    AU - Yang, H. C.

    PY - 2010/10/1

    Y1 - 2010/10/1

    N2 - A room-temperature-probe SQUID NDE system with high mobility and excellent spatial resolution has been developed for detecting the internal cracks of metallic material. Here, the sensing probe is composed of quadruple excitation coils and double D-shape pickup coils. It is connected to the input coil surrounding the SQUID sensor to transfer a magnetic field of eddy current. Following the previous demonstration of its good spatial resolution and high sensitivity, a signal mechanism for the scanning waveform is further proposed in this study to explain the scanning non-directionality of the system and analyze the internal cracks. Both fine and wide single cracks and multi-cracks with dense and spare intervals are valid. Moreover, the model is in good agreement with the test results.

    AB - A room-temperature-probe SQUID NDE system with high mobility and excellent spatial resolution has been developed for detecting the internal cracks of metallic material. Here, the sensing probe is composed of quadruple excitation coils and double D-shape pickup coils. It is connected to the input coil surrounding the SQUID sensor to transfer a magnetic field of eddy current. Following the previous demonstration of its good spatial resolution and high sensitivity, a signal mechanism for the scanning waveform is further proposed in this study to explain the scanning non-directionality of the system and analyze the internal cracks. Both fine and wide single cracks and multi-cracks with dense and spare intervals are valid. Moreover, the model is in good agreement with the test results.

    KW - Room-temperature probe

    KW - Superconducting quantum interference device (SQUID)

    KW - Waveform

    UR - http://www.scopus.com/inward/record.url?scp=77955510330&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=77955510330&partnerID=8YFLogxK

    U2 - 10.1016/j.ndteint.2010.06.002

    DO - 10.1016/j.ndteint.2010.06.002

    M3 - Article

    AN - SCOPUS:77955510330

    VL - 43

    SP - 586

    EP - 590

    JO - NDT and E International

    JF - NDT and E International

    SN - 0963-8695

    IS - 7

    ER -