Room-temperature two-terminal characteristics in silicon nano wires

S. F. Hu, W. Z. Wong, S. S. Liu, Y. G. Wu, C. L. Sung, T. Y. Huang, S. M. Sze

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Quantum effects in silicon nano wires due to 1-dimensional carrier confinement were observed at room temperature. Electrical transport properties were measured on narrow thin-silicon-on-insulator wires that were defined by e-beam lithography and further narrowed and thinned down by oxidation to a final thickness of around 3 nm, and a width of 29 nm. The room-temperature current-voltage characteristics of the resulting silicon nano wires were shown to exhibit a zero current state may be due to the occurrence of Coulomb blockade.

Original languageEnglish
Title of host publicationProceedings of the 2002 2nd IEEE Conference on Nanotechnology, IEEE-NANO 2002
PublisherIEEE Computer Society
Pages55-58
Number of pages4
ISBN (Electronic)0780375386
DOIs
Publication statusPublished - 2002 Jan 1
Event2nd IEEE Conference on Nanotechnology, IEEE-NANO 2002 - Washington, United States
Duration: 2002 Aug 262002 Aug 28

Publication series

NameProceedings of the IEEE Conference on Nanotechnology
Volume2002-January
ISSN (Print)1944-9399
ISSN (Electronic)1944-9380

Other

Other2nd IEEE Conference on Nanotechnology, IEEE-NANO 2002
CountryUnited States
CityWashington
Period02/8/2602/8/28

Keywords

  • Carrier confinement
  • Electric variables measurement
  • Electrons
  • Laboratories
  • Oxidation
  • Quantization
  • Silicon
  • Temperature
  • Wires
  • Writing

ASJC Scopus subject areas

  • Bioengineering
  • Electrical and Electronic Engineering
  • Materials Chemistry
  • Condensed Matter Physics

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  • Cite this

    Hu, S. F., Wong, W. Z., Liu, S. S., Wu, Y. G., Sung, C. L., Huang, T. Y., & Sze, S. M. (2002). Room-temperature two-terminal characteristics in silicon nano wires. In Proceedings of the 2002 2nd IEEE Conference on Nanotechnology, IEEE-NANO 2002 (pp. 55-58). [1032123] (Proceedings of the IEEE Conference on Nanotechnology; Vol. 2002-January). IEEE Computer Society. https://doi.org/10.1109/NANO.2002.1032123