Abstract
We report a room-temperature and high-mobility InGaZnO thin-film transistor on flexible substrate. To gain both high gate capacitance and low leakage current, we adopt stacked dielectric of Y2O3/TiO 2/Y2O3. This flexible IGZO TFT shows a low threshold voltage of 0.45 V, a small sub-threshold swing of 0.16 V/decade and very high field-effect mobility of 40 cm2/V. Such good performance is mainly contributed by improved gate stack structure and thickness modulation of IGZO channel that reduce the interface trap density without apparent mobility degradation.
| Original language | English |
|---|---|
| Pages (from-to) | 1459-1462 |
| Number of pages | 4 |
| Journal | Current Applied Physics |
| Volume | 13 |
| Issue number | 7 |
| DOIs | |
| Publication status | Published - 2013 |
Keywords
- InGaZnO (igzo)
- Thin film transistor (tft)
ASJC Scopus subject areas
- General Materials Science
- General Physics and Astronomy