Abstract
The contribution of gate materials to the photoresponse of thin-film field-effect photodetectors has long been overlooked, with prior studies focusing primarily on photoconductive and photogating effects within the sensing layer. Here, we show that under weak illumination, photocarriers primarily originate from the silicon gate rather than the MoS2 channel. Absorption spectra confirm that light is mainly absorbed by the gate, driving a negative photocurrent (NPC). The NPC magnitude and slope vary with illumination intensity and VDS, suggesting transport dominated by Si/SiO2 interface traps. NPC persists when MoS2 is replaced with Au/Ti, reinforcing the gate-driven mechanism. At higher powers, band bending reverses due to competing photovoltaic and trap-induced potentials. These results highlight the active role of the gate and offer strategies for device optimization.
| Original language | English |
|---|---|
| Pages (from-to) | 8266-8274 |
| Number of pages | 9 |
| Journal | ACS Nano |
| Volume | 20 |
| Issue number | 10 |
| DOIs | |
| Publication status | Published - 2026 Mar 17 |
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 7 Affordable and Clean Energy
Keywords
- MoSFET
- gate-induced injection
- interface traps
- negative photocurrent
- substrate-mediated effects
- weak-light photodetection
ASJC Scopus subject areas
- General Materials Science
- General Engineering
- General Physics and Astronomy
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