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Revealing the Active Role of the Gate Electrode in Weak-Light Detection

  • Tzu En Huang
  • , Chen Yu Wang
  • , Hua Hsing Liu
  • , Bor Wei Liang
  • , Shih Chia Peng
  • , You Jia Huang
  • , Yann Wen Lan*
  • , Kuan Ming Hung*
  • , Kuang Yao Lo*
  • *Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Abstract

The contribution of gate materials to the photoresponse of thin-film field-effect photodetectors has long been overlooked, with prior studies focusing primarily on photoconductive and photogating effects within the sensing layer. Here, we show that under weak illumination, photocarriers primarily originate from the silicon gate rather than the MoS2 channel. Absorption spectra confirm that light is mainly absorbed by the gate, driving a negative photocurrent (NPC). The NPC magnitude and slope vary with illumination intensity and VDS, suggesting transport dominated by Si/SiO2 interface traps. NPC persists when MoS2 is replaced with Au/Ti, reinforcing the gate-driven mechanism. At higher powers, band bending reverses due to competing photovoltaic and trap-induced potentials. These results highlight the active role of the gate and offer strategies for device optimization.

Original languageEnglish
Pages (from-to)8266-8274
Number of pages9
JournalACS Nano
Volume20
Issue number10
DOIs
Publication statusPublished - 2026 Mar 17

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

  1. SDG 7 - Affordable and Clean Energy
    SDG 7 Affordable and Clean Energy

Keywords

  • MoSFET
  • gate-induced injection
  • interface traps
  • negative photocurrent
  • substrate-mediated effects
  • weak-light photodetection

ASJC Scopus subject areas

  • General Materials Science
  • General Engineering
  • General Physics and Astronomy

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