Residual strain analysis of InxGa1- xAs/GaAs heteroepitaxial layers

V. Krishnamoorthy*, Y. W. Lin, L. Calhoun, H. L. Liu, R. M. Park

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

43 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Residual strain analysis of InxGa1- xAs/GaAs heteroepitaxial layers'. Together they form a unique fingerprint.

INIS

Material Science