Refractometric optical sensing by using a multilayer reflection and transmission narrowband filter

C. C. Liu; Y. H. Chang; C. J. Wu

doi:10.1163/156939310790735651

Refractometric optical sensing by using a multilayer reflection and transmission narrowband filter

C. C. Liu, Y. H. Chang, C. J. Wu^*

^*Corresponding author for this work

Undergraduate Program of Electro-Optical Engineering

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

Abstract

A refractometric optical sensing device based on a multilayer narrowband reflection and transmission filter with an ultrathin metallic film is proposed. By changing the refractive index of the defect layer in this narrowband filter, we find that the shift in the resonance peak wavelength is a sensitive function of the small variation in the refractive index. This sensing method is more compact and easier to make than the usual one based on the photonic crystal sensor.

Original language	English
Pages (from-to)	293-305
Number of pages	13
Journal	Journal of Electromagnetic Waves and Applications
Volume	24
Issue number	2-3
DOIs	https://doi.org/10.1163/156939310790735651
Publication status	Published - 2010 Jan 1

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
General Physics and Astronomy
Electrical and Electronic Engineering

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abstract = "A refractometric optical sensing device based on a multilayer narrowband reflection and transmission filter with an ultrathin metallic film is proposed. By changing the refractive index of the defect layer in this narrowband filter, we find that the shift in the resonance peak wavelength is a sensitive function of the small variation in the refractive index. This sensing method is more compact and easier to make than the usual one based on the photonic crystal sensor.",

author = "Liu, {C. C.} and Chang, {Y. H.} and Wu, {C. J.}",

note = "Funding Information: C.-J. Wu acknowledges the financial support from the National Science Council of the Republic of China under Contract No. NSC-97-2112-M-003-013-MY3.",

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N2 - A refractometric optical sensing device based on a multilayer narrowband reflection and transmission filter with an ultrathin metallic film is proposed. By changing the refractive index of the defect layer in this narrowband filter, we find that the shift in the resonance peak wavelength is a sensitive function of the small variation in the refractive index. This sensing method is more compact and easier to make than the usual one based on the photonic crystal sensor.

AB - A refractometric optical sensing device based on a multilayer narrowband reflection and transmission filter with an ultrathin metallic film is proposed. By changing the refractive index of the defect layer in this narrowband filter, we find that the shift in the resonance peak wavelength is a sensitive function of the small variation in the refractive index. This sensing method is more compact and easier to make than the usual one based on the photonic crystal sensor.

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Refractometric optical sensing by using a multilayer reflection and transmission narrowband filter

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