Refractometric optical sensing by using a multilayer reflection and transmission narrowband filter

C. C. Liu, Y. H. Chang, Chien-Jang Wu

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

A refractometric optical sensing device based on a multilayer narrowband reflection and transmission filter with an ultrathin metallic film is proposed. By changing the refractive index of the defect layer in this narrowband filter, we find that the shift in the resonance peak wavelength is a sensitive function of the small variation in the refractive index. This sensing method is more compact and easier to make than the usual one based on the photonic crystal sensor.

Original languageEnglish
Pages (from-to)293-305
Number of pages13
JournalJournal of Electromagnetic Waves and Applications
Volume24
Issue number2-3
DOIs
Publication statusPublished - 2010 Jan 1

Fingerprint

narrowband
Refractive index
Multilayers
refractivity
filters
Metallic films
Ultrathin films
Photonic crystals
photonics
Wavelength
Defects
shift
sensors
defects
Sensors
wavelengths
crystals

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Physics and Astronomy(all)
  • Electrical and Electronic Engineering

Cite this

Refractometric optical sensing by using a multilayer reflection and transmission narrowband filter. / Liu, C. C.; Chang, Y. H.; Wu, Chien-Jang.

In: Journal of Electromagnetic Waves and Applications, Vol. 24, No. 2-3, 01.01.2010, p. 293-305.

Research output: Contribution to journalArticle

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