Abstract
In this work, the transport properties of polycrystalline manganite La 0.7Sr0.3MnO3 (LSMO) films were investigated. The LSMO was grown on MgO(001) and SiO2/Si(001) substrates by using a magnetron dc sputtering technique to obtain polycrystalline films. It was found that the variation in the resistance with the temperature was dominated by the spin fluctuation around the magnetic domain walls. In addition, the reentrant spin glass gave rise to the upturn resistance of the polycrystalline LSMO films at low temperatures. The spin fluctuation and the reentrant effect also led to the significant magnetoresistance occurring in the LSMO films, which is larger than the colossal magnetoresistance of the LSMO film by one order of magnitude.
Original language | English |
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Pages (from-to) | 5754-5756 |
Number of pages | 3 |
Journal | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers |
Volume | 45 |
Issue number | 7 |
DOIs | |
Publication status | Published - 2006 Jul 7 |
Keywords
- Grain boundary
- Magnetoresistance
- Manganite
- Polycrystalline
- Reentrant effect
- Thin film
ASJC Scopus subject areas
- General Engineering
- General Physics and Astronomy