Reading process of integrated circuit layout debugging: Evidence from eye movements

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Finding bugs in CMOS Integrated Circuit (IC) layouts is a basic skill for IC design engineers and students alike. The reading process of finding bugs is the basis for learning and teaching in electronic engineering. In this pilot study, eye-movement data was used in analyzing the reading process and nature of five participants (N=5) finding bugs in CMOS layouts. Data analysis of eye movements was based on nine types of ROI (Region of Interest). The ANOVA analysis of eye movements was analyzed. The findings of experimental results included that there were significant differences among the number of fixations of nine types of ROIs. The findings suggest how learners could read the bugged IC layouts effectively and efficiently.

Original languageEnglish
Title of host publicationAdvanced Materials Researches, Engineering and Manufacturing Technologies in Industry
Pages855-860
Number of pages6
DOIs
Publication statusPublished - 2013 Oct 29
Event2013 2nd International Symposium on Materials Science and Engineering Technology, ISMSET 2013 - Guangzhou, China
Duration: 2013 Jun 272013 Jun 28

Publication series

NameAdvanced Materials Research
Volume787
ISSN (Print)1022-6680

Other

Other2013 2nd International Symposium on Materials Science and Engineering Technology, ISMSET 2013
CountryChina
CityGuangzhou
Period13/6/2713/6/28

    Fingerprint

Keywords

  • CMOS logic circuit
  • Eye movement
  • IC layout
  • Reading process

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Ho, H. F. (2013). Reading process of integrated circuit layout debugging: Evidence from eye movements. In Advanced Materials Researches, Engineering and Manufacturing Technologies in Industry (pp. 855-860). (Advanced Materials Research; Vol. 787). https://doi.org/10.4028/www.scientific.net/AMR.787.855