Raman scattering of ferroelectric lead lanthanum titanate thin films grown on fused quartz by metalorganic chemical vapor deposition

Z. C. Feng; J. H. Chen; J. Zhao; T. R. Yang; A. Erbil

doi:10.1016/j.ceramint.2003.12.098

Raman scattering of ferroelectric lead lanthanum titanate thin films grown on fused quartz by metalorganic chemical vapor deposition

Z. C. Feng^*, J. H. Chen, J. Zhao, T. R. Yang, A. Erbil

^*Corresponding author for this work

Department of Physics

Research output: Contribution to journal › Conference article › peer-review

5 Citations (Scopus)

Abstract

Highly textured lead lanthanum titanate (Pb_1-xLa _x)TiO₃ (PLT) thin films have been grown on fused quartz substrates by metalorganic chemical deposition (MOCVD). A series of PLT with different x between 0 and 0.32 were prepared and studied by Raman scattering. Raman spectra, measured at 300K and 80K, showed the features from the PLT film and quartz substrate. By using a "difference Raman" technique, more PLT modes are shown. The variations of the PLT Raman modes with the La composition and the measurement temperature are studied, and related physical phenomena and problems are discussed.

Original language	English
Pages (from-to)	1561-1564
Number of pages	4
Journal	Ceramics International
Volume	30
Issue number	7
DOIs	https://doi.org/10.1016/j.ceramint.2003.12.098
Publication status	Published - 2004
Event	3rd Asian Meeting on Electroceramics - Singapore, Singapore Duration: 2003 Dec 7 → 2003 Dec 11

Keywords

Lead lanthanum titanate
PLT
Raman scattering

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Ceramics and Composites
Process Chemistry and Technology
Surfaces, Coatings and Films
Materials Chemistry

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10.1016/j.ceramint.2003.12.098

Cite this

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title = "Raman scattering of ferroelectric lead lanthanum titanate thin films grown on fused quartz by metalorganic chemical vapor deposition",

abstract = "Highly textured lead lanthanum titanate (Pb1-xLa x)TiO3 (PLT) thin films have been grown on fused quartz substrates by metalorganic chemical deposition (MOCVD). A series of PLT with different x between 0 and 0.32 were prepared and studied by Raman scattering. Raman spectra, measured at 300K and 80K, showed the features from the PLT film and quartz substrate. By using a {"}difference Raman{"} technique, more PLT modes are shown. The variations of the PLT Raman modes with the La composition and the measurement temperature are studied, and related physical phenomena and problems are discussed.",

keywords = "Lead lanthanum titanate, PLT, Raman scattering",

author = "Feng, {Z. C.} and Chen, {J. H.} and J. Zhao and Yang, {T. R.} and A. Erbil",

year = "2004",

doi = "10.1016/j.ceramint.2003.12.098",

language = "English",

volume = "30",

pages = "1561--1564",

journal = "Ceramics International",

issn = "0272-8842",

publisher = "Elsevier Limited",

number = "7",

note = "3rd Asian Meeting on Electroceramics ; Conference date: 07-12-2003 Through 11-12-2003",

}

TY - JOUR

T1 - Raman scattering of ferroelectric lead lanthanum titanate thin films grown on fused quartz by metalorganic chemical vapor deposition

AU - Feng, Z. C.

AU - Chen, J. H.

AU - Zhao, J.

AU - Yang, T. R.

AU - Erbil, A.

PY - 2004

Y1 - 2004

N2 - Highly textured lead lanthanum titanate (Pb1-xLa x)TiO3 (PLT) thin films have been grown on fused quartz substrates by metalorganic chemical deposition (MOCVD). A series of PLT with different x between 0 and 0.32 were prepared and studied by Raman scattering. Raman spectra, measured at 300K and 80K, showed the features from the PLT film and quartz substrate. By using a "difference Raman" technique, more PLT modes are shown. The variations of the PLT Raman modes with the La composition and the measurement temperature are studied, and related physical phenomena and problems are discussed.

AB - Highly textured lead lanthanum titanate (Pb1-xLa x)TiO3 (PLT) thin films have been grown on fused quartz substrates by metalorganic chemical deposition (MOCVD). A series of PLT with different x between 0 and 0.32 were prepared and studied by Raman scattering. Raman spectra, measured at 300K and 80K, showed the features from the PLT film and quartz substrate. By using a "difference Raman" technique, more PLT modes are shown. The variations of the PLT Raman modes with the La composition and the measurement temperature are studied, and related physical phenomena and problems are discussed.

KW - Lead lanthanum titanate

KW - PLT

KW - Raman scattering

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U2 - 10.1016/j.ceramint.2003.12.098

DO - 10.1016/j.ceramint.2003.12.098

M3 - Conference article

AN - SCOPUS:4344704652

SN - 0272-8842

VL - 30

SP - 1561

EP - 1564

JO - Ceramics International

JF - Ceramics International

IS - 7

T2 - 3rd Asian Meeting on Electroceramics

Y2 - 7 December 2003 through 11 December 2003

ER -

Raman scattering of ferroelectric lead lanthanum titanate thin films grown on fused quartz by metalorganic chemical vapor deposition

Abstract

Keywords

ASJC Scopus subject areas

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