Raman scattering of ferroelectric lead lanthanum titanate thin films grown on fused quartz by metalorganic chemical vapor deposition

Z. C. Feng, J. H. Chen, J. Zhao, T. R. Yang, A. Erbil

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2 Citations (Scopus)


Highly textured lead lanthanum titanate (Pb1-xLa x)TiO3 (PLT) thin films have been grown on fused quartz substrates by metalorganic chemical deposition (MOCVD). A series of PLT with different x between 0 and 0.32 were prepared and studied by Raman scattering. Raman spectra, measured at 300K and 80K, showed the features from the PLT film and quartz substrate. By using a "difference Raman" technique, more PLT modes are shown. The variations of the PLT Raman modes with the La composition and the measurement temperature are studied, and related physical phenomena and problems are discussed.

Original languageEnglish
Pages (from-to)1561-1564
Number of pages4
JournalCeramics International
Issue number7
Publication statusPublished - 2004 Sep 7



  • Lead lanthanum titanate
  • PLT
  • Raman scattering

ASJC Scopus subject areas

  • Ceramics and Composites

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