TY - GEN
T1 - Quantum well nanopillar transistors
AU - Hu, Shu Fen
AU - Sung, Chin Lung
PY - 2006
Y1 - 2006
N2 - We have fabricated vertical quantum well nanopillar transistors that consist of a vertical stack of coupled asymmetric quantum wells in a poly-silicon/ silicon nitride multilayer nano-pillars configuration with each well having a unique size. The devices consist of resonant tunneling in the poly-silicon/ silicon nitride stacked pillar material system surrounded by a Schottky gate. The gate electrode surrounds half side of a silicon pillar island, and the channel region exists at all the pillar silicon island. Current-voltage measurements at room temperature show prominent quantum effects due to electron resonance tunneling with side-gate. Accordingly, the vertical transistor offers high-shrinkage feature. By using the occupied area of the ULSI can be shrunk to 10% of that using conventional planar transistor. The small-occupied area leads to the small capacitance and the small load resistance, resulting in high speed and low power operation.
AB - We have fabricated vertical quantum well nanopillar transistors that consist of a vertical stack of coupled asymmetric quantum wells in a poly-silicon/ silicon nitride multilayer nano-pillars configuration with each well having a unique size. The devices consist of resonant tunneling in the poly-silicon/ silicon nitride stacked pillar material system surrounded by a Schottky gate. The gate electrode surrounds half side of a silicon pillar island, and the channel region exists at all the pillar silicon island. Current-voltage measurements at room temperature show prominent quantum effects due to electron resonance tunneling with side-gate. Accordingly, the vertical transistor offers high-shrinkage feature. By using the occupied area of the ULSI can be shrunk to 10% of that using conventional planar transistor. The small-occupied area leads to the small capacitance and the small load resistance, resulting in high speed and low power operation.
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U2 - 10.1557/proc-0913-d03-03
DO - 10.1557/proc-0913-d03-03
M3 - Conference contribution
AN - SCOPUS:33846045642
SN - 1558998691
SN - 9781558998698
T3 - Materials Research Society Symposium Proceedings
SP - 85
EP - 92
BT - Transistor Scaling-Methods, Materials and Modeling
PB - Materials Research Society
T2 - 2006 MRS Spring Meeting
Y2 - 18 April 2006 through 19 April 2006
ER -