Punch-through and junction breakdown characteristics for uniaxial strained nano-node metal-oxide-semiconductor field-effect transistors on (100) wafers
- Mu Chun Wang
- , Heng Sheng Huang
- , Min Ru Peng
- , Shea Jue Wang
- , Tsao Yeh Chen*
- , Wen Shiang Liao
- , Hsin Chia Yang
- , Chuan Hsi Liu
*Corresponding author for this work
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