Punch-through and junction breakdown characteristics for uniaxial strained nano-node metal-oxide-semiconductor field-effect transistors on (100) wafers

Mu Chun Wang, Heng Sheng Huang, Min Ru Peng, Shea Jue Wang, Tsao Yeh Chen*, Wen Shiang Liao, Hsin Chia Yang, Chuan Hsi Liu

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

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