Properties of Co(1120) /Mo(1oo) /MgO(100) bilayers

I. Klik; U. M. Chen; Y. D. Yao; C. K. Lo; C. P. Chang; S. Y. Liao; Y. Liou

doi:10.1016/S0169-4332(96)00835-5

Properties of Co(1120) /Mo(1oo) /MgO(100) bilayers

I. Klik^*, U. M. Chen, Y. D. Yao, C. K. Lo, C. P. Chang, S. Y. Liao, Y. Liou

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

Abstract

Co(1120)/Mo(100)/MgO(100) bilayers were grown using molecular beam epitaxy; the thickness of the Co layer was 200 Å and that of the Mo buffer 0, 6, 20 and 50 Å, respectively. Their magnetic, electric and surface properties were studied as functions of the non-magnetic buffer layer thickness and coercivity, resistivity and magnetization at 1 T were found to be correlated with surface roughness. The static scaling exponent was determined to be α = 0.58 ± 0.02 for all films, regardless of the roughness and topography of their surface.

Original language	English
Pages (from-to)	165-168
Number of pages	4
Journal	Applied Surface Science
Volume	113-114
DOIs	https://doi.org/10.1016/S0169-4332(96)00835-5
Publication status	Published - 1997 Apr
Externally published	Yes

Keywords

Co thin films
Electric conductivity
Magnetic hysteresis
Scaling
Surface topography

ASJC Scopus subject areas

General Chemistry
Condensed Matter Physics
General Physics and Astronomy
Surfaces and Interfaces
Surfaces, Coatings and Films

Access to Document

10.1016/S0169-4332(96)00835-5

Cite this

@article{70fc35d86df14f0d94bf9494952cb8e0,

title = "Properties of Co(1120) /Mo(1oo) /MgO(100) bilayers",

abstract = "Co(1120)/Mo(100)/MgO(100) bilayers were grown using molecular beam epitaxy; the thickness of the Co layer was 200 {\AA} and that of the Mo buffer 0, 6, 20 and 50 {\AA}, respectively. Their magnetic, electric and surface properties were studied as functions of the non-magnetic buffer layer thickness and coercivity, resistivity and magnetization at 1 T were found to be correlated with surface roughness. The static scaling exponent was determined to be α = 0.58 ± 0.02 for all films, regardless of the roughness and topography of their surface.",

keywords = "Co thin films, Electric conductivity, Magnetic hysteresis, Scaling, Surface topography",

author = "I. Klik and Chen, {U. M.} and Yao, {Y. D.} and Lo, {C. K.} and Chang, {C. P.} and Liao, {S. Y.} and Y. Liou",

note = "Funding Information: This researchw as sponsoredb y the National Science Council of the R.O.C. under grants No. 85 2112-M-001-019, 85-2112-M-006-018 and 852112-M-O 1l -020.",

year = "1997",

month = apr,

doi = "10.1016/S0169-4332(96)00835-5",

language = "English",

volume = "113-114",

pages = "165--168",

journal = "Applied Surface Science",

issn = "0169-4332",

publisher = "Elsevier",

}

TY - JOUR

T1 - Properties of Co(1120) /Mo(1oo) /MgO(100) bilayers

AU - Klik, I.

AU - Chen, U. M.

AU - Yao, Y. D.

AU - Lo, C. K.

AU - Chang, C. P.

AU - Liao, S. Y.

AU - Liou, Y.

N1 - Funding Information: This researchw as sponsoredb y the National Science Council of the R.O.C. under grants No. 85 2112-M-001-019, 85-2112-M-006-018 and 852112-M-O 1l -020.

PY - 1997/4

Y1 - 1997/4

N2 - Co(1120)/Mo(100)/MgO(100) bilayers were grown using molecular beam epitaxy; the thickness of the Co layer was 200 Å and that of the Mo buffer 0, 6, 20 and 50 Å, respectively. Their magnetic, electric and surface properties were studied as functions of the non-magnetic buffer layer thickness and coercivity, resistivity and magnetization at 1 T were found to be correlated with surface roughness. The static scaling exponent was determined to be α = 0.58 ± 0.02 for all films, regardless of the roughness and topography of their surface.

AB - Co(1120)/Mo(100)/MgO(100) bilayers were grown using molecular beam epitaxy; the thickness of the Co layer was 200 Å and that of the Mo buffer 0, 6, 20 and 50 Å, respectively. Their magnetic, electric and surface properties were studied as functions of the non-magnetic buffer layer thickness and coercivity, resistivity and magnetization at 1 T were found to be correlated with surface roughness. The static scaling exponent was determined to be α = 0.58 ± 0.02 for all films, regardless of the roughness and topography of their surface.

KW - Co thin films

KW - Electric conductivity

KW - Magnetic hysteresis

KW - Scaling

KW - Surface topography

UR - http://www.scopus.com/inward/record.url?scp=0031547448&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0031547448&partnerID=8YFLogxK

U2 - 10.1016/S0169-4332(96)00835-5

DO - 10.1016/S0169-4332(96)00835-5

M3 - Article

AN - SCOPUS:0031547448

SN - 0169-4332

VL - 113-114

SP - 165

EP - 168

JO - Applied Surface Science

JF - Applied Surface Science

ER -

Properties of Co(1120) /Mo(1oo) /MgO(100) bilayers

Abstract

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this