Precision sinusoidal local scan for large-range atomic force microscopy with auxiliary optical microscopy

Chih Lieh Chen, Jim Wei Wu, Yi Ting Lin, Li Chen Fu, Mei-Yung Chen

Research output: Contribution to journalArticle

15 Citations (Scopus)

Abstract

Atomic force microscopy (AFM) is a powerful measurement instrument which can build 3-D topography image of conductive and nonconductive samples at nanoscale resolution. However, due to the scan method of conventional AFM, the induced mechanical resonance of the scanner and the scan in area of uninterest would strictly limit the scan speed. In this study, we improve these problems with our designed AFM system from three aspects. First, the sinusoidal trajectory is applied to lateral scanning of the AFM rather than the traditional raster trajectory, so the scan rate can be increased without inducing vibration of the lateral scanner. Second, with this promising scan trajectory, the internal model principle-based neural network complementary sliding-mode controller and adaptive complementary sliding-mode controller are designed to achieve high precision scanning and to cope with the system parameter uncertainties and external disturbance. Finally, with the aid of an auxiliary optical microscopy and the scanned information during the scanning process, scan path planning can be adopted to focus the scanning on samples such that the total scan time is further shortened. Extensive experimental results are provided to show the appealing performance of the proposed method.

Original languageEnglish
Article number6787105
Pages (from-to)226-236
Number of pages11
JournalIEEE/ASME Transactions on Mechatronics
Volume20
Issue number1
DOIs
Publication statusPublished - 2015 Jan 1

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Optical microscopy
Atomic force microscopy
Scanning
Trajectories
Controllers
Motion planning
Topography
Neural networks

Keywords

  • Adaptive control
  • atomic force microscopy (AFM)
  • complementary sliding-mode control
  • internal model principle (IMP)
  • neural network
  • sinusoidal scan

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Computer Science Applications
  • Electrical and Electronic Engineering

Cite this

Precision sinusoidal local scan for large-range atomic force microscopy with auxiliary optical microscopy. / Chen, Chih Lieh; Wu, Jim Wei; Lin, Yi Ting; Fu, Li Chen; Chen, Mei-Yung.

In: IEEE/ASME Transactions on Mechatronics, Vol. 20, No. 1, 6787105, 01.01.2015, p. 226-236.

Research output: Contribution to journalArticle

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